학술논문
'학술논문'
에서 검색결과 73건 | 목록
1~10
Academic Journal
Hönicke, P.; Wählisch, A.; Unterumsberger, R.; Beckhoff, B.; Bogdanowicz, J.; Charley, A.-L.; Mertens, H.; Rochat, N.; Hartmann, J.-M.; Giambacorti, N.
In: Nanotechnology . (Nanotechnology, 8 July 2024, 35(28))
Academic Journal
Bogdanowicz, J.; Nuytten, T.; Sergeant, S.; Oniki, Y.; Gowda, P.P.; Mertens, H.; Charley, A.-L.; Gawlik, A.
In: Nano Letters . (Nano Letters, 31 January 2024, 24(4):1191-1196)
Periodical
Sendelbach, Matthew J.; Schuch, Nivea G.; Beggiato, M.; Cerbu, D.; Loo, R.; Sun, W.; Moussa, A.; Bast, G.; Fukaya, K.; Beral, C.; Charley, A.-L.; Janardan, N.; Cross, A.; Lorusso, G.; Isawa, M.; Belmonte, A.; Kar, G. Sankar; Bogdanowicz, J.
Proceedings of SPIE; April 2024, Vol. 12955 Issue: 1 p129551F-129551F-9, 1165969p
Conference
Vega-Gonzalez, V.; Montero, D.; Versluijs, J.; Pedreira, O. Varela; Jourdan, N.; Puliyalil, H.; Chehab, B.; Peissker, T.; Haider, A.; Batuk, D.; Martinez, G. T.; Geypen, J.; Le, Q. T.; Bazzazian, N.; Heylen, N.; van der Veen, M.; El-Mekki, Z.; Webers, T.; Vats, H.; Rynders, L.; Cupak, M.; Uk-Lee, J.; Drissi, Y.; Halipre, L.; Gillijns, W.; Charley, A.-L.; Verdonck, P.; Witters, T.; Gompel, S. V.; Kimura, Y.; Ciofi, I.; De Wachter, B.; Swerts, J.; Grieten, E.; Ercken, M.; Kim, R.; Croes, K.; Leray, P.; Jaysankar, M.; Nagesh, N.; Ramakers, L.; Murdoch, G.; Park, S.; Tokei, Z.; Dentoni-Litta, E.; Horiguchi, N.
2021 IEEE International Interconnect Technology Conference (IITC) Interconnect Technology Conference (IITC), 2021 IEEE International. :1-3 Jul, 2021
Academic Journal
Bogdanowicz, J.; Oniki, Y.; Kenis, K.; Gowda, P.P.; Mertens, H.; Charley, A.-L.; Shamieh, B.; Leon, Y.; Wormington, M.; Van Der Meer, J.
In: Journal of Micro/Nanopatterning, Materials and Metrology . (Journal of Micro/Nanopatterning, Materials and Metrology, 1 July 2023, 22(3))
Academic Journal
Mack, C.A.; Yannuzzi, J.; Lorusso, G.; Zidan, M.; De Simone, D.; Weldeslassie, A.; Vandenbroeck, N.; Foubert, P.; Beral, C.; Charley, A.-L.
In: Journal of Micro/Nanopatterning, Materials and Metrology . (Journal of Micro/Nanopatterning, Materials and Metrology, 1 April 2023, 22(2):21007)
Academic Journal
Zidan, M.; Severi, J.; De Gendt, S.; De Simone, D.; Moussa, A.; Charley, A.-L.; Leray, P.; Lorusso, G.F.; Fischer, D.; Müllender, A.; Mack, C.
In: Journal of Micro/Nanopatterning, Materials and Metrology . (Journal of Micro/Nanopatterning, Materials and Metrology, 1 April 2023, 22(2))
Conference
Shohjoh, T.; Ikota, M.; Isawa, M.; Lorusso, G. F.; Horiguchi, N.; Briggs, B.; Mertens, H.; Bogdanowicz, J.; De Bisschop, P.; Charley, A.-L.
2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :3.3.1-3.3.4 Dec, 2021
Conference
Vega-Gonzalez, V.; Puliyalil, H.; Versluijs, J.; Lesniewska, A.; Varela-Pereira, O.; Baert, R.; Paolillo, S.; Decoster, S.; Schleicher, F.; Montero, D.; Bekaert, J.; Kesters, E.; Le, Q. T.; Lorant, C.; Teugels, L.; Heylen, N.; Jourdan, N.; El-Mekki, Z.; van der Veen, M.; Ciofi, I.; Briggs, B.; Heijlen, J.; Dupas, L.; De-Wachter, B.; Vancoille, E.; Webers, T.; Vats, H.; Rynders, L.; Cupak, M.; Uk-Lee, J.; Drissi, Y.; Halipre, L.; Charley, A.-L.; Verdonck, P.; Witters, T.; Gompel, S. V.; Kimura, Y.; Demonie, I.; Lazzarino, F.; Ercken, M; Kim, R.; Trivkovic, D.; Croes, K.; Leray, P.; Jaysankar, M.; Wilson., C.; Muroch, G.; Tokei, Z.
2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :20.5.1-20.5.4 Dec, 2020
Conference
Vega-Gonzalez, V.; Wilson, C. J.; Briggs, B.; Decoster, S.; Versluijs, J.; Lesniewska, A.; Paolillo, S.; Baert, R.; Puliyalil, H.; Bekaert, J.; Kesters, E.; Le, Q. T.; Lorant, C.; Varela P., O.; Teugels, L.; Heylen, N.; El-Mekki, Z.; van der Veen, M.; Webers, T.; Vats, H.; Rynders, L.; Cupak, M.; Uk-Lee, J.; Drissi, Y.; Halipre, L.; Charley, A.-L.; Verdonck, P.; Witters, T.; Gompel, S. V.; Kimura, Y.; Jourdan, N.; Ciofi, I.; Gupta, A.; Contino, A.; Boccardi, G.; Lariviere, S.; Dupas, L.; De-Wachter, B.; Vancoille, E.; Lazzarino, F.; Ercken, M; Debacker, P.; Kim, R.; Trivkovic, D.; Croes, K.; Leray, P.; Dillemans, L.; Chen, Y.-F.; Tokei, Z.
2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :19.3.1-19.3.4 Dec, 2019
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[AR] Charley, A.-L.
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