학술논문
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Conference
Lu, C.A.; Lee, H.P.; Chen, H.C.; Lin, Y.C.; Chung, Y.H.; Wang, S.H.; Yeh, J.Y.; Chang, V.S.; Chiang, M.C.; Chang, W.; Chung, H.C.; Cheng, C.F.; Hsu, H.H.; Liu, H.H.; Chen, William P.N.; Lin, C.Y.
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023
Conference
Wu, Shien-Yang; Chang, C.H.; Chiang, M.C.; Lin, C.Y.; Liaw, J.J.; Cheng, J.Y.; Yeh, J.Y.; Chen, H.F.; Chang, S.Y.; Lai, K.T.; Liang, M.S.; Pan, K.H.; Chen, J.H.; Chang, V.S.; Luo, T.C.; Wang, X.; Mor, Y.S.; Lin, C.I.; Wang, S.H.; Hsieh, M.Y.; Chen, C.Y.; Wu, B.F.; Lin, C.J.; Liang, C.S.; Tsao, C.P.; Li, C.T.; Chen, C.H.; Hsieh, C.H.; Liu, H.H.; Chen, P.N.; Chen, C.C.; Chen, R.; Yeo, Y.C.; Chui, C.O.; Chang, W.; Lee, T.L.; Huang, K.B.; Lin, H.J.; Chen, K.W.; Tsai, M.H.; Chen, K.S.; Chen, X.M.; Cheng, Y.K.; Wang, C.H.; Shue, W.; Ku, Y.; Jang, S. M.; Cao, M.; Lu, L.C.; Chang, T.S.
2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :27.5.1-27.5.4 Dec, 2022
Conference
Chang, Chih-Hao; Chang, V.S.; Pan, K.H.; Lai, K.T.; Lu, J. H.; Ng, J.A.; Chen, C.Y.; Wu, B.F.; Lin, C.J.; Liang, C.S.; Tsao, C.P.; Mor, Y.S.; Li, C.T.; Lin, T.C.; Hsieh, C.H.; Chen, P.N.; Hsu, H.H.; Chen, J.H.; Chen, H.F.; Yeh, J.Y.; Chiang, M.C.; Lin, C.Y.; Liaw, J.J.; Wang, C.H.; Lee, S.B.; Chen, C.C.; Lin, H.J.; Chen, R.; Chen, K.W.; Chui, C.O.; Yeo, Y.C.; Huang, K.B.; Lee, T.L.; Tsai, M.H.; Chen, K.S.; Lu, Y.C.; Jang, S.M.; Wu, S.-Y.
2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :27.1.1-27.1.4 Dec, 2022
Academic Journal
In: Malaysian Journal of Biochemistry and Molecular Biology . (Malaysian Journal of Biochemistry and Molecular Biology, April 2023, 26(1):152-162)
Conference
Hou, Y.T.; Yen, F.Y.; Hsu, P.F.; Chang, V.S.; Lim, P.S.; Hung, C.L.; Yao, L.G.; Jiang, J.C.; Lin, H.J.; Jin, Y.; Jang, S.M.; Tao, H.J.; Chen, S.C.; Liang, M.S.
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :31-34 2005
Conference
2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866) Integrated circuit design and technology Integrated Circuit Design and Technology, 2004. ICICDT '04. International Conference on. :363-366 2004
Conference
Wu, Shien-Yang; Lin, C.Y.; Chiang, M.C.; Liaw, J.J.; Cheng, J.Y.; Chang, C.H.; Chang, V.S.; Pan, K.H.; Tsai, C.H.; Yao, C.H.; Miyashita, T.; Wu, Y.K.; Ting, K.C.; Hsieh, C.H.; Tsui, R.F.; Chen, R.; Yang, C.L.; Chang, H.C.; Lee, C.Y.; Chen, K.S.; Ku, Y.; Jang, S. M.
2016 IEEE Symposium on VLSI Technology VLSI Technology, 2016 IEEE Symposium on. :1-2 Jun, 2016
Conference
2003 8th International Symposium Plasma- and Process-Induced Damage. Plasma- and process-induced damage Plasma- and Process-Induced Damage, 2003 8th International Symposium. :130-133 2003
Conference
2003 8th International Symposium Plasma- and Process-Induced Damage. Plasma- and process-induced damage Plasma- and Process-Induced Damage, 2003 8th International Symposium. :126-129 2003
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제한된 항목
[AR] Chang, V.S.
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