학술논문
'학술논문'
에서 검색결과 40건 | 목록
1~10
Academic Journal
Schmidt, D.; Cepler, A.; Durfee, C.; Pancharatnam, S.; Frougier, J.; Breton, M.; Greene, A.; Klare, M.; Koret, R.; Turovets, I.
IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 35(3):412-417 Aug, 2022
Academic Journal
Schmidt, D.; Medikonda, M.; Rizzolo, M.; Silvestre, C.; Frougier, J.; Greene, A.; Breton, M.; Cepler, A.; Ofek, J.; Kaplan, I.; Koret, R.; Turovets, I.
In: Journal of Micro/Nanopatterning, Materials and Metrology . (Journal of Micro/Nanopatterning, Materials and Metrology, 1 July 2023, 22(3))
Conference
Schoeche, S.; Schmidt, D.; Han, J.; Butt, S.; Sieg, K.; Cheng, M.; Cepler, A.; Dror, S.; Ofek, J.; Osherov, I.; Turovets, I.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control XXXVIII. (Proceedings of SPIE - The International Society for Optical Engineering, 2024, 12955)
Academic Journal
Schmidt, D.; Durfee, C.; Li, J.; Loubet, N.; Cepler, A.; Neeman, L.; Meir, N.; Ofek, J.; Oren, Y.; Fishman, D.
In: Journal of Micro/Nanopatterning, Materials and Metrology . (Journal of Micro/Nanopatterning, Materials and Metrology, 1 April 2022, 21(2))
Periodical
Robinson, John C.; Sendelbach, Matthew J.; Schmidt, D.; Medikonda, M.; Rizzolo, M.; Silvestre, C.; Frougier, J.; Greene, A.; Breton, M.; Cepler, A.; Ofek, J.; Kaplan, I.; Koret, R.; Turovets, I.
Proceedings of SPIE; May 2022, Vol. 12053 Issue: 1 p120530S-120530S-9, 1084780p
Periodical
Adan, Ofer; Robinson, John C.; Schmidt, D.; Durfee, C.; Li, J.; Loubet, N.; Cepler, A.; Neeman, L.; Meir, N.; Ofek, J.; Oren, Y.; Fishman, D.
Proceedings of SPIE; February 2021, Vol. 11611 Issue: 1 p116111T-116111T-12, 11495002p
Periodical
Adan, Ofer; Robinson, John C.; Schmidt, D.; Durfee, C.; Pancharatnam, S.; Medikonda, M.; Greene, A.; Frougier, J.; Cepler, A.; Belkin, G.; Shafir, D.; Koret, R.; Shtainman, R.; Turovets, I.; Wolfling, S.
Proceedings of SPIE; February 2021, Vol. 11611 Issue: 1 p116111U-116111U-11, 11495001p
Academic Journal
Conference
Schmidt, D.; Medikonda, M.; Rizzolo, M.; Silvestre, C.; Frougier, J.; Greene, A.; Breton, M.; Cepler, A.; Ofek, J.; Kaplan, I.; Koret, R.; Turovets, I.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control XXXVI. (Proceedings of SPIE - The International Society for Optical Engineering, 2022, 12053)
Conference
Nourbakhsh, A.; Yu, L.; Sherwood, T.; Hung, P.Y.; Chen, X.; Krishnan, S.; Cepler, A.; Cheng, M.; Oren, Y.
In: ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings , 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2022. (ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings, 2022, 2022-May)
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제한된 항목
[AR] Cepler, A.
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