학술논문
'학술논문'
에서 검색결과 83건 | 목록
1~10
Conference
Bastos, J. P.; O'Sullivan, B. J.; Higashi, Y.; Chasin, A.; Franco, J.; Arimura, H.; Ganguly, J.; Capogreco, E.; Spessot, A.; Horiguchi, N.
2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :P36.PI-1-P36.PI-7 Apr, 2024
Academic Journal
Spessot, A.; Matagne, P.; Arimura, H.; Ganguly, J.; Ritzenthaler, R.; Bastos, J.; Sarkar, R.; Capogreco, E.; Horiguchi, N.; Chen, Y.
In: Japanese Journal of Applied Physics . (Japanese Journal of Applied Physics, 1 March 2024, 63(3))
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(12):6985-6990 Dec, 2022
Conference
Bastos, J. P.; O'Sullivan, B. J.; Franco, J.; Tyaginov, S.; Truijen, B.; Chasin, A.; Degraeve, R.; Kaczer, B.; Ritzenthaler, R.; Capogreco, E.; Litta, E. D.; Spessot, A.; Higashi, Y.; Yoon, Y.; Machkaoutsan, V.; Fazan, P.; Horiguchi, N.
2022 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2022 IEEE International. :1-6 Mar, 2022
Conference
Capogreco, E.; Arimura, H.; Ritzenthaler, R.; Brus, S.; Oniki, Y.; Dupuy, E.; Sebaai, F.; Radisic, D.; Chan, B. T.; Zhou, D.; Machkaoutsan, V.; Yoon, S.; Itokawa, H.; Yamaguchi, M.; Gao, Z.; Fazan, P.; Chen, Y.; Subramanian, S.; Ragnarsson, L.-A.; Spessot, A.; Litta, E. Dentoni; Horiguchi, N.
2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :26.2.1-26.2.4 Dec, 2022
Conference
Ritzenthaler, R.; Capogreco, E.; Dupuy, E.; Arimura, H.; Bastos, J. P.; Favia, P.; Sebaai, F.; Radisic, D.; Nguyen, V. T. H.; Mannaert, G.; Chan, B. T.; Machkaoutsan, V.; Yoon, Y.; Itokawa, H.; Yamaguchi, M.; Chen, Y.; Fazan, P.; Subramanian, S.; Spessot, A.; Dentoni Litta, E.; Samavedam, S.; Horiguchi, N.
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2022 IEEE Symposium on. :306-307 Jun, 2022
Academic Journal
Gupta, A.; Pedreira, O.V.; Arutchelvan, G.; Zahedmanesh, H.; Devriendt, K.; Mertens, H.; Tao, Z.; Ritzenthaler, R.; Wang, S.; Radisic, D.; Kenis, K.; Teugels, L.; Sebai, F.; Lorant, C.; Jourdan, N.; Chan, B.T.; Subramanian, S.; Schleicher, F.; Hopf, T.; Peter, A.P.; Rassoul, N.; Debruyn, H.; Demonie, I.; Siew, Y.K.; Chiarella, T.; Briggs, B.; Zhou, X.; Rosseel, E.; De Keersgieter, A.; Capogreco, E.; Litta, E.D.; Boccardi, G.; Baudot, S.; Mannaert, G.; Bontemps, N.; Sepulveda, A.; Mertens, S.; Kim, M.; Dupuy, E.; Vandersmissen, K.; Paolillo, S.; Yakimets, D.; Chehab, B.; Favia, P.; Drijbooms, C.; Cousserier, J.; Jaysankar, M.; Lazzarino, F.; Morin, P.; Altamirano, E.; Mitard, J.; Wilson, C.J.; Holsteyns, F.; Boemmels, J.; Demuynck, S.; Tokei, Z.; Horiguchi, N.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(12):5349-5354 Dec, 2020
Academic Journal
Capogreco, E.; Witters, L.; Arimura, H.; Sebaai, F.; Porret, C.; Hikavyy, A.; Loo, R.; Milenin, A.P.; Eneman, G.; Favia, P.; Bender, H.; Wostyn, K.; Dentoni Litta, E.; Schulze, A.; Vrancken, C.; Opdebeeck, A.; Mitard, J.; Langer, R.; Holsteyns, F.; Waldron, N.; Barla, K.; De Heyn, V.; Mocuta, D.; Collaert, N.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 65(11):5145-5150 Nov, 2018
Conference
Arimura, H.; Capogreco, E.; Wostyn, K.; Eneman, G.; Ragnarsson, L. A.; Brus, S.; Baudot, S.; Peter, A.; Schram, T.; Favia, P.; Richard, O.; Bender, H.; Mitard, J.; Horiguchi, N.
2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020
Conference
Subramanian, S.; Hosseini, M.; Chiarella, T.; Sarkar, S.; Schuddinck, P.; Chan, B. T.; Radisic, D.; Mannaert, G.; Hikavyy, A.; Rosseel, E.; Sebaai, F.; Peter, A.; Hopf, T.; Morin, P.; Wang, S.; Devriendt, K.; Batuk, D.; Martinez, G. T.; Veloso, A.; Litta, E. Dentoni; Baudot, S.; Siew, Y. K.; Zhou, X.; Briggs, B.; Capogreco, E.; Hung, J.; Koret, R.; Spessot, A.; Ryckaert, J.; Demuynck, S.; Horiguchi, N.; Boemmels, J.
2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020
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제한된 항목
[AR] Capogreco, E.
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