학술논문
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1~10
Academic Journal
Sio, H.; Moody, J.D.; Pollock, B.B.; Strozzi, D.J.; Ho, D.D.-M.; Walsh, C.A.; Kemp, G.E.; Lahmann, B.; Kucheyev, S.O.; Kozioziemski, B.; Carroll, E.G.; Kroll, J.; Yanagisawa, D.K.; Angus, J.; Bachmann, B.; Baker, A.A.; Bayu Aji, L.B.; Bhandarkar, S.D.; Bude, J.D.; Divol, L.; Engwall, A.M.; Ferguson, B.; Fry, J.; Hagler, L.; Hartouni, E.; Herrmann, M.C.; Hsing, W.; Holunga, D.M.; Javedani, J.; Johnson, A.; Khan, S.; Kalantar, D.; Kohut, T.; Logan, B.G.; Masters, N.; Nikroo, A.; Izumi, N.; Orsi, N.; Piston, K.; Provencher, C.; Rowe, A.; Sater, J.; Shin, S.J.; Skulina, K.; Stygar, W.A.; Tang, V.; Winters, S.E.; Zimmerman, G.; Chittenden, J.P.; Appelbe, B.; Boxall, A.; Crilly, A.; O'Neill, S.; Barnak, D.; Davies, J.; Peebles, J.; Bae, J.H.; Clark, K.; Havre, M.; Mauldin, M.; Ratledge, M.; Vonhof, S.; Adrian, P.; Reichelt, B.; Fujioka, S.; Fraenkel, M.
In: Physics of Plasmas . (Physics of Plasmas, 1 July 2023, 30(7))
Academic Journal
Kerr, S.M.; Rusby, D.; Williams, G.J.; Schlossberg, D.J.; Alessi, D.; Ayers, J.; Azhar, S.; Aufderheide, M.B.; Bowers, M.W.; Bude, J.D.; Chen, H.; Cochran, G.; Crane, J.; Nicola, J.M.D.; Fittinghoff, D.N.; Golick, B.; Grim, G.P.; Hamamoto, M.; Heredia, R.; Hermann, M.; Herriot, S.; Hill, M.P.; Kalantar, D.; Kemp, A.; Lafortune, K.; Lemos, N.; Link, A.; Lowe-Webb, R.; Macphee, A.; Martinez, D.; Patankar, S.; Pelz, L.; Prantil, M.A.; Siders, C.W.; Wegner, P.; Wilks, S.; Williams, W.; Mackinnon, A.J.; Meaney, K.; Geppert-Kleinrath, H.; Kim, Y.; Aghedo, A.; Fitzsimmons, P.; Haid, A.; Hoke, W.; Manuel, M.; Mauldin, M.; Quinn, M.; Vonhof, S.; Youngblood, K.
In: Physics of Plasmas . (Physics of Plasmas, January 2023, 30(1))
Academic Journal
Moody, J.D.; Pollock, B.B.; Sio, H.; Strozzi, D.J.; Ho, D.D.-M.; Walsh, C.A.; Kemp, G.E.; Lahmann, B.; Kucheyev, S.O.; Kozioziemski, B.; Carroll, E.G.; Kroll, J.; Yanagisawa, D.K.; Angus, J.; Bachmann, B.; Bhandarkar, S.D.; Bude, J.D.; Divol, L.; Ferguson, B.; Fry, J.; Hagler, L.; Hartouni, E.; Herrmann, M.C.; Hsing, W.; Holunga, D.M.; Izumi, N.; Javedani, J.; Johnson, A.; Khan, S.; Kalantar, D.; Kohut, T.; Logan, B.G.; Masters, N.; Nikroo, A.; Orsi, N.; Piston, K.; Provencher, C.; Rowe, A.; Sater, J.; Skulina, K.; Stygar, W.A.; Tang, V.; Winters, S.E.; Zimmerman, G.; Adrian, P.; Chittenden, J.P.; Appelbe, B.; Boxall, A.; Crilly, A.; O'neill, S.; Davies, J.; Peebles, J.; Fujioka, S.
In: Physical Review Letters . (Physical Review Letters, 4 November 2022, 129(19))
Academic Journal
Moody, J.D.; Pollock, B.B.; Sio, H.; Strozzi, D.J.; Ho, D.D.-M.; Walsh, C.; Kemp, G.E.; Kucheyev, S.O.; Kozioziemski, B.; Carroll, E.G.; Kroll, J.; Yanagisawa, D.K.; Angus, J.; Bhandarkar, S.D.; Bude, J.D.; Divol, L.; Ferguson, B.; Fry, J.; Hagler, L.; Hartouni, E.; Herrmann, M.C.; Hsing, W.; Holunga, D.M.; Javedani, J.; Johnson, A.; Kalantar, D.; Kohut, T.; Logan, B.G.; Masters, N.; Nikroo, A.; Orsi, N.; Piston, K.; Provencher, C.; Rowe, A.; Sater, J.; Skulina, K.; Stygar, W.A.; Tang, V.; Winters, S.E.; Chittenden, J.P.; Appelbe, B.; Boxall, A.; Crilly, A.; O’Neill, S.; Davies, J.; Peebles, J.; Fujioka, S.
In: Journal of Fusion Energy . (Journal of Fusion Energy, June 2022, 41(1))
Academic Journal
Weir, B.E. ; Alam, M.A.; Silverman, P.J.; Baumann, F.; Monroe, D.; Bude, J.D.; Timp, G.L.; Hamad, A.; Ma, Y.; Brown, M.M.; Hwang, D.; Sorsch, T.W.; Ghetti, A.; Wilk, G.D.
In Solid State Electronics 2002 46(3):321-328
Conference
International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) Electron devices meeting Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International. :339-342 2000
Conference
2000 International Conference on Simulation Semiconductor Processes and Devices (Cat. No.00TH8502) Simulation of semiconductor processes and devices Simulation of Semiconductor Processes and Devices, 2000. SISPAD 2000. 2000 International Conference on. :23-26 2000
Conference
Weir, B.E.; Silverman, P.J.; Alam, M.A.; Baumann, F.; Monroe, D.; Ghetti, A.; Bude, J.D.; Timp, G.L.; Hamad, A.; Oberdick, T.M.; Zhao, N.X.; Ma, Y.; Brown, M.M.; Hwang, D.; Sorsch, T.W.; Madic, J.
International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) Electron devices Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International. :437-440 1999
Secondary Electron flash-a high performance, low power flash technology for 0.35 /spl mu/m and below
Conference
Bude, J.D.; Mastrapasqua, M.; Pinto, M.R.; Gregor, R.W.; Kelley, P.J.; Kohler, R.A.; Leung, C.W.; Ma, Y.; McPartland, R.J.; Roy, P.K.; Singh, R.
International Electron Devices Meeting. IEDM Technical Digest Electron Devices Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International. :279-282 1997
Conference
International Electron Devices Meeting. Technical Digest Electron devices Electron Devices Meeting, 1996. IEDM '96., International. :391-394 1996
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[AR] Bude, J.D.
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