학술논문
'학술논문'
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1~10
Conference
Chien, W.C.; Lai, E.K.; Buzi, L.; Cheng, C.W.; Yeh, C.W.; Ray, A.; Gignac, L.M.; Gong, N.; Cheng, H.Y.; Grun, A.; Lee, D.Y.; Kim, W.; Majumdar, A.; Bishop, D.; Bruce, R.L.; Daudelin, D.; Ho, H.Y.; BrightSky, M.; Lung, H.L.
2023 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2023 IEEE International. :1-4 May, 2023
Conference
Bruce, R.L.; Sarwat, S. Ghazi; Boybat, I.; Cheng, C.-W.; Kim, W.; Nandakumar, S.R.; Mackin, C.; Philip, T.; Liu, Z.; Brew, K.; Gong, N.; Ok, I.; Adusumilli, P.; Spoon, K.; Ambrogio, S.; Kersting, B.; Bohnstingl, T.; Gallo, M. Le; Simon, A.; Li, N.; Saraf, I.; Han, J.-P.; Gignac, L.; Papalia, J.M.; Yamashita, T.; Saulnier, N.; Burr, G. W.; Tsai, H.; Sebastian, A.; Narayanan, V.; BrightSky, M.
2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-6 Mar, 2021
Academic Journal
Khaddam-Aljameh, R.; Martemucci, M.; Kersting, B.; Le Gallo, M.; Bruce, R.L.; BrightSky, M.; Sebastian, A.
IEEE Transactions on Circuits and Systems II: Express Briefs IEEE Trans. Circuits Syst. II Circuits and Systems II: Express Briefs, IEEE Transactions on. 68(12):3522-3526 Dec, 2021
Academic Journal
Sarwat, S.G.; Le Gallo, M.; Kersting, B.; Jonnalagadda, V.P.; Sebastian, A.; Bruce, R.L.; BrightSky, M.; Brew, K.; Ok, I.; Saulnier, N.
In: Advanced Materials . (Advanced Materials, 14 September 2023, 35(37))
Superb Endurance and Appropriate Vth of PCM Pillar Cell using Buffer Layer for 3D Cross-Point Memory
Conference
Gong, N.; Chien, W.C.; Ray, A.; Gignac, L.M.; Yeh, C.W.; Yang, C.H.; Bruce, R.L.; Cheng, H.Y.; Kim, W.; Kuo, I.T.; Cheng, C.W.; Carta, F.; Papalia, J.M.; Lai, E.K.; Lung, H.L.; BrightSky, M.
2019 IEEE 11th International Memory Workshop (IMW) Memory Workshop (IMW), 2019 IEEE 11th International. :1-4 May, 2019
Conference
Chien, W.C.; Gignac, L.M.; Gong, N.; Yeh, C.W.; Yang, C.H.; Bruce, R.L.; Cheng, H.Y.; Papalia, J.M.; Miyazoe, H.; Cheng, C.W.; Kim, W.; Kuo, I.T.; Carta, F.; Ray, A.; Lai, E.K.; BrightSky, M.; Lung, H.L.
2019 IEEE 11th International Memory Workshop (IMW) Memory Workshop (IMW), 2019 IEEE 11th International. :1-4 May, 2019
Academic Journal
Chien, W.; Yeh, C.; Bruce, R.L.; Cheng, H.; Kuo, I.T.; Yang, C.; Ray, A.; Miyazoe, H.; Kim, W.; Carta, F.; Lai, E.; BrightSky, M.J.; Lung, H.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 65(11):5172-5179 Nov, 2018
Academic Journal
Mackin, C.; Chen, A.; Narayanan, P.; Ambrogio, S.; Fasoli, A.; Luquin, J.; Friz, A.; Tsai, H.; Burr, G.W.; Rasch, M.J.; Bruce, R.L.; Li, N.; Timcheck, J.; Le Gallo, M.; Nandakumar, S.R.; Sebastian, A.
In: Nature Communications . (Nature Communications, December 2022, 13(1))
Conference
Chien, W.C.; Sung, C.L.; Yeh, C.W.; Cheng, H.Y.; Liu, Z.L.; Lai, E.K.; Zheng, J.X.; Grun, A.; Lung, H.L.; Ho, H.Y.; Bruce, R.L.; Cheng, C.W.; Ray, A.; Daudelin, D.; BrightSky, M.
In: 2024 IEEE International Memory Workshop, IMW 2024 - Proceedings , 2024 IEEE International Memory Workshop, IMW 2024 - Proceedings. (2024 IEEE International Memory Workshop, IMW 2024 - Proceedings, 2024)
Conference
Borges, J.; Yan, H.; Gignac, L.; Ocola, L.; Hopstaken, M.; Molis, S.; Bruce, R.L.; Simon, A.; Arnold, J.; Koty, D.; Rogalskyj, S.; Shearer, J.
In: Proceedings of SPIE - The International Society for Optical Engineering , Advanced Etch Technology and Process Integration for Nanopatterning XIII. (Proceedings of SPIE - The International Society for Optical Engineering, 2024, 12958)
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[AR] Bruce, R.L.
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