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Campabadal, F.; Fleta, C.; Key, M.; Lozano, M.; Martinez, C.; Pellegrini, G.; Rafi, J.M.; Ullan, M.; Johansen, L.; Pommeresche, B.; Stugu, B.; Ciocio, A.; Fadeyev, V.; Gilchriese, M.; Haber, C.; Siegrist, J.; Spieler, H.; Vu, C.; Bell, P.J.; Charlton, D.G.; Dowell, J.D.; Gallop, B.J.; Homer, R.J.; Jovanovic, P.; Mahout, G.; McMahon, T.J.; Wilson, J.A.; Barr, A.J.; Carter, J.R.; Fromant, B.P.; Goodrick, M.J.; Hill, J.C.; Lester, C.G.; Palmer, M.J.; Parker, M.A.; Robinson, D.; Sabetfakhri, A.; Shaw, R.J.; Anghinolfi, F.; Chesi, E.; Chouridou, S.; Fortin, R.; Grosse-Knetter, J.; Gruwe, M.; Ferrari, P.; Jarron, P.; Kaplon, J.; Macpherson, A.; Niinikoski, T.; Pernegger, H.; Roe, S.; Rudge, A.; Ruggiero, G.; Wallny, R.; Weilhammer, P.; Bialas, W.; Dabrowski, W.; Grybos, P.; Koperny, S.; Blocki, J.; Bruckman, P.; Gadomski, S.; Godlewski, J.; Gornicki, E.; Malecki, P.; Moszczynski, A.; Stanecka, E.; Stodulski, M.; Szczygiel, R.; Turala, M.; Wolter, M.; Ahmad, A.; Benes, J.; Carpentieri, C.; Feld, L.; Ketterer, C.; Ludwig, J.; Meinhardt, J.; Runge, K.; Mikulec, B.; Mangin-Brinet, M.; D’Onofrio, M.; Donega, M.; Moêd, S.; Sfyrla, A.; Ferrere, D.; Clark, A.G.; Perrin, E.; Weber, M.; Bates, R.L.; Cheplakov, A.; Saxon, D.H.; O’Shea, V.; Smith, K.M.; Iwata, Y.; Ohsugi, T.; Kohriki, T.; Kondo, T.; Terada, S.; Ujiie, N.; Ikegami, Y.; Unno, Y.; Takashima, R.; Brodbeck, T.; Chilingarov, A.; Hughes, G.; Ratoff, P.; Sloan, T.; Allport, P.P.; Casse, G.-L.; Greenall, A.; Jackson, J.N.; Jones, T.J.; King, B.T.; Maxfield, S.J.; Smith, N.A.; Sutcliffe, P.; Vossebeld, J.; Beck, G.A.; Carter, A.A.; Lloyd, S.L.; Martin, A.J.; Morris, J.; Morin, J.; Nagai, K.; Pritchard, T.W.; Anderson, B.E.; Butterworth, J.M.; Fraser, T.J.; Jones, T.W.; Lane, J.B.; Postranecky, M.; Warren, M.R.M.; Cindro, V.; Kramberger, G.; Mandić, I.; Mikuž, M.; Duerdoth, I.P.; Freestone, J.; Foster, J.M.; Ibbotson, M.; Loebinger, F.K.; Pater, J.; Snow, S.W.; Thompson, R.J.; Atkinson, T.M.; Bright, G.; Kazi, S.; Lindsay, S.; Moorhead, G.F. ; Taylor, G.N.; Bachindgagyan, G.; Baranova, N.; Karmanov, D.; Merkine, M.; Andricek, L.; Bethke, S.; Kudlaty, J.; Lutz, G.; Moser, H.-G.; Nisius, R.; Richter, R.; Schieck, J.; Cornelissen, T.; Gorfine, G.W.; Hartjes, F.G.; Hessey, N.P.; de Jong, P.; Muijs, A.J.M.; Peeters, S.J.M.; Tomeda, Y.; Tanaka, R.; Nakano, I.; Dorholt, O.; Danielsen, K.M.; Huse, T.; Sandaker, H.; Stapnes, S.; Bargassaa, P.; Reichold, A.; Huffman, T.; Nickerson, R.; Weidberg, A.; Doucas, G.; Hawes, B.; Lau, W.; Howell, D.; Kundu, N.; Wastie, R.; Bohm, J.; Mikestikova, M.; Stastny, J.; Broklová, Z.; Brož, J.; Doležal, Z.; Kodyš, P.; Kubík, P.; Řezníček, P.; Vorobel, V.; Wilhelm, I.; Chren, D.; Horazdovsky, T.; Linhart, V.; Pospisil, S.; Sinor, M.; Solar, M.; Sopko, B.; Stekl, I.; Ardashev, E.N.; Golovnya, S.N.; Gorokhov, S.A.; Kholodenko, A.G.; Rudenko, R.E.; Ryadovikov, V.N.; Vorobiev, A.P.; Adkin, P.J.; Apsimon, R.J.; Batchelor, L.E.; Bizzell, J.P.; Booker, P.; Davis, V.R.; Easton, J.M.; Fowler, C.; Gibson, M.D.; Haywood, S.J.; MacWaters, C.; Matheson, J.P.; Matson, R.M.; McMahon, S.J.; Morris, F.S.; Morrissey, M.; Murray, W.J.; Phillips, P.W.; Tyndel, M.; Villani, E.G.; Dorfan, D.E.; Grillo, A.A.; Rosenbaum, F.; Sadrozinski, H.F.-W.; Seiden, A.; Spencer, E.; Wilder, M.; Booth, P.; Buttar, C.M.; Dawson, I.; Dervan, P.; Grigson, C.; Harper, R.; Moraes, A.; Peak, L.S.; Varvell, K.E.; Chu, Ming-Lee; Hou, Li-Shing; Lee, Shih-Chang; Teng, Ping-Kun; Wan, Changchun; Hara, K.; Kato, Y.; Kuwano, T.; Minagawa, M.; Sengoku, H.; Bingefors, N.; Brenner, R.; Ekelöf, T.; Eklund, L.; Bernabeu, J.; Civera, J.V.; Costa, M.J.; Fuster, J.; Garcia, C.; Garcia, J.E.; Gonzalez-Sevilla, S.; Lacasta, C.; Llosa, G.; Marti-Garcia, S.; Modesto, P.; Sanchez, J.; Sospedra, L.; Vos, M.; Fasching, D.; Gonzalez, S.; Jared, R.C.; Charles, E.
In Nuclear Inst. and Methods in Physics Research, A 2005 538(1):384-407
Academic Journal
In: Analytical Methods . (Analytical Methods, 21 December 2020, 12(47):5718-5728)
Conference
Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) Electrical overstress/electrostatic discharge symposium Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000. :66-71 2000
Academic Journal
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 11(4):509-515 Dec, 2011
Conference
Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) Electrical overstress/electrostatic discharge Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1998. :320-327 1998
Conference
Chaine, M.; Verhaege, K.; Avery, L.; Kelly, M.; Gieser, H.; Bock, K.; Henry, L.G.; Meuse, T.; Brodbeck, T.; Barth, J.
Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) Electrical overstress/electrostatic discharge Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1998. :301-310 1998
Conference
2006 Electrical Overstress/Electrostatic Discharge Symposium Electrical Overstress/Electrostatic Discharge Symposium, 2006. EOS/ESD '06.. :285-294 Sep, 2006
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2006 Electrical Overstress/Electrostatic Discharge Symposium Electrical Overstress/Electrostatic Discharge Symposium, 2006. EOS/ESD '06.. :144-151 Sep, 2006
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2006 Electrical Overstress/Electrostatic Discharge Symposium Electrical Overstress/Electrostatic Discharge Symposium, 2006. EOS/ESD '06.. :136-143 Sep, 2006
Conference
2005 Electrical Overstress/Electrostatic Discharge Symposium Electrical Overstress/Electrostatic Discharge Symposium, 2005. EOS/ESD '05.. :1-6 Sep, 2005
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