학술논문
'학술논문'
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Report
Huijten, Esmee; Roelvink, Yannick; Brackenhoff, Stefanie A.; Taniguchi, Akio; Bakx, Tom J. L. C.; Marthi, Kaushal B.; Zaalberg, Stan; Baselmans, Jochem J. A.; Chin, Kah Wuy; Huiting, Robert; Karatsu, Kenichi; Laguna, Alejandro Pascual; Tamura, Yoichi; Takekoshi, Tatsuya; Yates, Stephen; van Hoven, Maarten; Endo, Akira
Proc. SPIE 11453, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy X, 114533C (2020)
Report
Snik, Frans; Bos, Steven P.; Brackenhoff, Stefanie A.; Doelman, David S.; Por, Emiel H.; Bettonvil, Felix; Rodenhuis, Michiel; Vorobiev, Dmitry; Eshelman, Laura M.; Shaw, Joseph A.
Applied Optics Vol. 59, Issue 21, pp. F71-F77 (2020)
Periodical
Zmuidzinas, Jonas; Gao, Jian-Rong; Huijten, Esmee; Roelvink, Yannick; Brackenhoff, Stefanie A.; Taniguchi, Akio; Bakx, Tom J. L. C.; Marthi, Kaushal B.; Zaalberg, Stan; Baselmans, Jochem J. A.; Chin, Kah Wuy; Huiting, Robert; Karatsu, Kenichi; Pascual Laguna, Alejandro; Tamura, Yoichi; Takekoshi, Tatsuya; Yates, Stephen J. C.; van Hoven, Maarten; Endo, Akira
Proceedings of SPIE; December 2020, Vol. 11453 Issue: 1 p114533C-114533C-20, 11338788p
Academic Journal
Huijten, Esmee; Roelvink, Yannick; Brackenhoff, Stefanie A.; Taniguchi, Akio; Bakx, Tom J. L. C.; Marthi, Kaushal B.; Zaalberg, Stan; Doing, Anne-Kee; Baselmans, Jochem J. A.; Chin, Kah Wuy; Huiting, Robert; Karatsu, Kenichi; Laguna, Alejandro Pascual; Tamura, Yoichi; Takekoshi, Tatsuya; Yates, Stephen J. C.; van Hoven, Maarten; Endo, Akira
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[AR] Brackenhoff, Stefanie A.
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