학술논문
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Academic Journal
Deabreu, A.; Bowness, C.; Alizadeh, A.; Chartrand, C.; Brunelle, N.A.; Macquarrie, E.R.; Ruether, M.; Kazemi, M.; Thewalt, M.L.W.; Higginbottom, D.B.; Simmons, S.; Lee-Hone, N.R.; Kurkjian, A.T.K.; Roorda, S.; Abrosimov, N.V.; Pohl, H.-J.
In: Optics Express . (Optics Express, 24 April 2023, 31(9):15045-15057)
Report
Kurkjian, A. T. K.; Higginbottom, D. B.; Chartrand, C.; MacQuarrie, E. R.; Klein, J. R.; Lee-Hone, N. R.; Stacho, J.; Bowness, C.; Bergeron, L.; DeAbreu, A.; Brunelle, N. A.; Harrigan, S. R.; Kanaganayagam, J.; Kazemi, M.; Marsden, D. W.; Richards, T. S.; Stott, L. A.; Roorda, S.; Morse, K. J.; Thewalt, M. L. W.; Simmons, S.
Academic Journal
Higginbottom, D.B.; Kurkjian, A.T.K.; Chartrand, C.; Kazemi, M.; Brunelle, N.A.; MacQuarrie, E.R.; Klein, J.R.; Lee-Hone, N.R.; Stacho, J.; Ruether, M.; Bowness, C.; Bergeron, L.; DeAbreu, A.; Harrigan, S.R.; Kanaganayagam, J.; Marsden, D.W.; Richards, T.S.; Stott, L.A.; Morse, K.J.; Thewalt, M.L.W.; Simmons, S.; Roorda, S.
In: Nature . (Nature, 14 July 2022, 607(7918):266-270)
Periodical
Hemmer, Philip R.; Migdall, Alan L.; Higginbottom, D. B.; DeAbreu, A.; Bowness, C.; Alizadeh, A.; Chartrand, C.; Brunelle, N. A.; MacQuarrie, E. R.; Lee-Hone, N. R.; Ruether, M.; Kazemi, M.; Kurkjian, A. T. K.; Thewalt, M. L. W.; Simmons, S.
Proceedings of SPIE; March 2023, Vol. 12446 Issue: 1 p124460T-124460T-9, 1120150p
Conference
Higginbottom, D.B.; DeAbreu, A.; Bowness, C.; Alizadeh, A.; Chartrand, C.; Brunelle, N.A.; MacQuarrie, E.R.; Ruether, M.; Kazemi, M.; Thewalt, M.L.W.; Simmons, S.; Lee-Hone, N.R.; Kurkjian, A.T.K.
In: Proceedings of SPIE - The International Society for Optical Engineering , Quantum Computing, Communication, and Simulation III. (Proceedings of SPIE - The International Society for Optical Engineering, 2023, 12446)
Academic Journal
Deabreu, A.; Bowness, C.; Abraham, R.J.S.; Medvedova, A.; Morse, K.J.; Thewalt, M.L.W.; Simmons, S.; Riemann, H.; Abrosimov, N.V.; Becker, P.; Pohl, H.-J.
In: Physical Review Applied . (Physical Review Applied, 11 April 2019, 11(4))
Academic Journal
Morse, K.J.; Abraham, R.J.S.; DeAbreu, A.; Bowness, C.; Richards, T.S.; Thewalt, M.L.W.; Simmons, S.; Riemann, H.; Abrosimov, N.V.; Becker, P.; Pohl, H.-J.
In: Science Advances . (Science Advances, 5 July 2017, 3(7))
Conference
International Technical Digest on Electron Devices Meeting Electron Devices Meeting, 1989. IEDM '89. Technical Digest., International. :199-202 1989
Academic Journal
In: Journal of Beliefs & Values . (Journal of Beliefs & Values, 1 April 1994, 15(1):3-5)
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[AR] Bowness, C.
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