학술논문
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Academic Journal
In Journal of Non-Crystalline Solids May 2002 303(1):12-16
Academic Journal
Zybill, C.E. ; Boubekeur, H.; Radojkovic, P.; Schwartzkopff, M.; Hartmann, E.; Koch, F.; Groos, G.; Rezek, B.; Bruchhaus, R.; Wersing, W.
In Surface Science 1 October 1999 440(1-2):221-230
Academic Journal
In: Toxicologic Pathology . (Toxicologic Pathology, 1 June 2020, 48(4):586-592)
Conference
Nagel, N.; Muller, T.; Isler, M.; Pissors, V.; Sachse, J.-U.; Manger, D.; Caspary, D.; Parascandola, S.; Olligs, D.; Boubekeur, H.; Heinrichsdorff, F.; Bach, L.; Polei, V.; Gupta, J.; Pritchard, D.; Riedel, S.; Strassburg, M.; Deppe, J.; Bewersdorff-Sarlette, U.; Verhoeven, M.; Lattard, L.; Markert, M.; Ruttkowski, E.; Mikalo, R.; Willer, J.; Schulze, N.; Ludwig, C.; V. Kamienski, E.G.S.; Mikolajick, T.; Kusters, K.-H.; Shappir, A.; Shur, Y.; Lusky, E.; Eitan, B.
2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) VLSI Technology, Systems and Applications, 2007. VLSI-TSA 2007. International Symposium on. :1-2 Apr, 2007
Conference
Nagel, N.; Olligs, D.; Polei, V.; Parascandola, S.; Boubekeur, H.; Bach, L.; Muller, T.; Strassburg, M.; Riedel, S.; Kratzert, P.; Caspary, D.; Deppe, J.; Wilier, J.; Schulze, N.; Mikolajick, T.; Kusters, K.-H.; Shappir, A.; Redmard, E.; Bloom, I.; Eitan, B.
Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005. VLSI Technology VLSI Technology, 2005. Digest of Technical Papers. 2005 Symposium on. :120-121 2005
Academic Journal
Conference
Prechtl, G.; Kersch, A.; Schulze Icking-Konert, G.; Jacobs, W.; Hecht, T.; Boubekeur, H.; Schroder, U.
IEEE International Electron Devices Meeting 2003 Electron devices IEDM'03 Electron Devices Meeting, 2003. IEDM '03 Technical Digest. IEEE International. :9.6.1-9.6.4 2003
Conference
Boubekeur, H.; Mikolajick, T.; Höpfner, J.; Dehm, C.; Pamler, W.; Steiner, J.; Kilian, G.; Kolbesen, B.O.; Bauer, A.; Frey, L.; Ryssel, H.
In: Diffusion and Defect Data Pt.B: Solid State Phenomena . (Diffusion and Defect Data Pt.B: Solid State Phenomena, 2000, 76-77:9-14)
Conference
Mueller, Torsten; Kleint, C.; Fitz, C.; Isler, M.; Riedel, S.; Sachse, J.-U.; Olligs, D.; Boubekeur, H.; Heinrichsdorf, F.; Polei, V.; Pritchard, D.; Verhoeven, M.; Lattard, L.; Markert, M.; Schupke, C.; Tippelt, B.; Teichert, S.; Reisdorf, R.; Ludwig, C.; Stein v. Kamienski, E. G.
MRS Online Proceedings Library; 2007, Vol. 997 Issue 1, p1-6, 6p
Conference
Zybill, C.E.; Boubekeur, H.; Radojkovic, P.; Schwartzkopff, M.; Hartmann, E.; Koch, F.; Groos, G.; Rezek, B.; Bruchhaus, R.; Wersing, W.
In: Materials Research Society Symposium - Proceedings . (Materials Research Society Symposium - Proceedings, 1999, 541:449-456)
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[AR] Boubekeur, H.
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