학술논문
'학술논문'
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Academic Journal
Reher, T.; Huyghe, Y.; Bisschop, J.; Van de Poel, B.; Lavaert, C.; Willockx, B.; Cappelle, J.; Martens, J.A.; Diels, J.
In: Applied Energy . (Applied Energy, 1 April 2024, 359)
Academic Journal
van Zanten, R.; Beck, D.; Zietse, R.; Massey, E.K.; van Dijk, M.; van Rosmalen, J.; Van Hecke, A.; van Staa, A.L.; Goedendorp, M.; van den Hoogen, M.; Ista, E.; Maasdam, L.; Manintveld, O.; de Weerd, A.; van Zanten, R.; Been-Dahmen, J.; Bisschop, J.; van der Boog, P.; Konijn, M.; van Helden, M.; Hilbrands, L.; Annema, C.; Engelsman, L.; Norder, T.; Oosterhoff, C.; Saro, I.; Smeenge, G.; Bosman, S.; van Zuilen, A.; van Buren, M.; Kho, M.; Reinders, M.; Dam, R.; van Diemen, T.; Nijgh, E.; de Haan, E.; Kooistra, A.
In: Trials . (Trials, December 2022, 23(1))
Conference
2016 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2016 IEEE International. :69-72 2016
Academic Journal
In Geochimica et Cosmochimica Acta 2006 70(7):1728-1738
Academic Journal
In Journal of Structural Geology 2005 27(6):943-947
Academic Journal
Nguyen, H.V.; Salm, C.; Vroemen, J.; Voets, J.; Krabbenborg, B.; Bisschop, J.; Mouthaan, A.J.; Kuper, F.G.
In Microelectronics Reliability 2002 42(9):1415-1420
Academic Journal
Yang, D.G.; Ernst, L.J.; van `t Hof, C.; Kiasat, M.S.; Bisschop, J.; Janssen, J.; Kuper, F.; Liang, Z.N.; Schravendeel, R.; Zhang, G.Q.
In Microelectronics Reliability August-October 2000 40(8-10):1533-1538
Conference
van Silfhout, R.B.R.; van Driel, W.D.; Li, Y.; van Gils, M.A.J.; Janssen, J.H.J.; Zhang, G.Q.; Tao, G.; Bisschop, J.; Ernst, L.J.
5th International Conference on Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems, 2004. EuroSimE 2004. Proceedings of the EuroSimE 2004 Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems, 2004. EuroSimE 2004. Proceedings of the 5th International Conference on. :69-74 2004
Conference
Nguyen, H.V.; Salm, C.; Vroemen, J.; Voets, J.; Krabbenborg, B.; Bisschop, J.; Mouthaan, A.J.; Kuper, F.G.
Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2002. IPFA 2002. Proceedings of the 9th International Symposium on the. :135-139 2002
Academic Journal
In: Huisarts en Wetenschap . (Huisarts en Wetenschap, 1 October 2020, 63(10):73-75)
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[AR] Bisschop, J.
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