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Academic Journal
In: Nutrients . (Nutrients, February 2024, 16(4))
Periodical
Kim, Ryoung-Han; Lafferty, Neal V.; Venkatesan, R.; Guven, C.; Bhawe, D.; Greenwood, A. R.; Zhang, Z.; Gupta, P.; Saksena, P.; Rodriguez, R.; Moumen, N.; Bains, B.; Sun, P.; Aykol, M.; Wallace, C.; Bigwood, R.; Fischer, K.
Proceedings of SPIE; April 2023, Vol. 12495 Issue: 1 p124950D-124950D-10, 12370061p
Academic Journal
In: Melbourne University Law Review . (Melbourne University Law Review, 2021, 45(1):60-98)
Conference
Thompson, S.; Anand, N.; Armstrong, M.; Auth, C.; Arcot, B.; Alavi, M.; Bai, P.; Bielefeld, J.; Bigwood, R.; Brandenburg, J.; Buehler, M.; Cea, S.; Chikarmane, V.; Choi, C.; Frankovic, R.; Ghani, T.; Glass, G.; Han, W.; Hoffmann, T.; Hussein, M.; Jacob, P.; Jain, A.; Jan, C.; Joshi, S.; Kenyon, C.; Klaus, J.; Klopcic, S.; Luce, J.; Ma, Z.; Mcintyre, B.; Mistry, K.; Murthy, A.; Nguyen, P.; Pearson, H.; Sandford, T.; Schweinfurth, R.; Shaheed, R.; Sivakumar, S.; Taylor, M.; Tufts, B.; Wallace, C.; Wang, P.; Weber, C.; Bohr, M.
Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :61-64 2002
Conference
Tyagi, S.; Alavi, M.; Bigwood, R.; Bramblett, T.; Brandenburg, J.; Chen, W.; Crew, B.; Hussein, M.; Jacob, P.; Kenyon, C.; Lo, C.; McIntyre, B.; Ma, Z.; Moon, P.; Nguyen, P.; Rumaner, L.; Schweinfurth, R.; Sivakumar, S.; Stettler, M.; Thompson, S.; Tufts, B.; Xu, J.; Yang, S.; Bohr, M.
International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) Electron devices meeting Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International. :567-570 2000
Conference
Brain, R.; Agrawal, S.; Becher, D.; Bigwood, R.; Buehler, M.; Chikarmane, V.; Childs, M.; Choi, J.; Daviess, S.; Ganpule, C.; He, J.; Hentges, P.; Jin, I.; Klopcic, S.; Malyavantham, G.; McFadden, B.; Neulinger, J.; Neirynck, J.; Neirynck, Y.; Pelto, C.; Plekhanov, P.; Shusterman, Y.; Van, T.; Weiss, M.; Williams, S.; Xia, F.; Yashar, P.; Yeoh, A.
2009 IEEE International Interconnect Technology Conference Interconnect Technology Conference, 2009. IITC 2009. IEEE International. :249-251 Jun, 2009
Conference
Venkatesan, R.; Guven, C.; Bhawe, D.; Greenwood, A.R.; Zhang, Z.; Gupta, P.; Saksena, P.; Rodriguez, R.; Moumen, N.; Bains, B.; Sun, P.; Aykol, M.; Wallace, C.; Bigwood, R.; Fischer, K.
In: Proceedings of SPIE - The International Society for Optical Engineering , DTCO and Computational Patterning II. (Proceedings of SPIE - The International Society for Optical Engineering, 2023, 12495)
Conference
Thompson, S.; Alavi, M.; Arghavani, R.; Brand, A.; Bigwood, R.; Brandenburg, J.; Crew, B.; Dubin, V.; Hussein, M.; Jacob, P.; Kenyon, C.; Lee, E.; Mcintyre, B.; Ma, Z.; Moon, P.; Nguyen, P.; Prince, M.; Schweinfurth, R.; Sivakumar, S.; Smith, P.; Stettler, M.; Tyagi, S.; Wei, M.; Xu, J.; Yang, S.; Bohr, M.
International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) Electron devices meeting 2001 Electron Devices Meeting, 2001. IEDM '01. Technical Digest. International. :11.6.1-11.6.4 2001
Conference
Venkatesan, R.; Guven, C.; Bhawe, D.; Greenwood, A.R.; Zhang, Z.; Gupta, P.; Saksena, P.; Rodriguez, R.; Moumen, N.; Bains, B.; Aykol, M.; Wallace, C.; Bigwood, R.; Fischer, K.
In: Proceedings of SPIE - The International Society for Optical Engineering , International Conference on Extreme Ultraviolet Lithography 2022. (Proceedings of SPIE - The International Society for Optical Engineering, 2022, 12292)
Periodical
Itani, Toshiro; Naulleau, Patrick P.; Gargini, Paolo A.; Ronse, Kurt G.; Venkatesan, R.; Guven, C.; Bhawe, D.; Greenwood, A. R.; Zhang, Z.; Gupta, P.; Saksena, P.; Rodriguez, R.; Moumen, N.; Bains, B.; Aykol, M.; Wallace, C.; Bigwood, R.; Fischer, K.
Proceedings of SPIE; December 2022, Vol. 12292 Issue: 1 p1229202-1229202-9
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[AR] Bigwood, R.
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