학술논문
'학술논문'
에서 검색결과 79건 | 목록
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Academic Journal
In Microelectronics Reliability November 2023 150
Academic Journal
IEEE Transactions on Aerospace and Electronic Systems IEEE Trans. Aerosp. Electron. Syst. Aerospace and Electronic Systems, IEEE Transactions on. 59(2):2072-2076 Apr, 2023
Academic Journal
Balen, T.R.; González, C.J.; Butzen, P.F.; Oliveira, I.F.V.; da Rosa Jr, L.S.; Soares, R.I.; Schvittz, R.B.; Added, N.; Macchione, E.L.A.; Aguiar, V.A.P.; Medina, N.H.; Guazzelli, M.A.
In: Journal of Electronic Testing: Theory and Applications (JETTA) . (Journal of Electronic Testing: Theory and Applications (JETTA), August 2023, 39(4):409-420)
Academic Journal
Gonzalez, C.J.; Added, N.; Macchione, E.L.A.; Aguiar, V.A.P.; Kastensmidt, F.G.L.; Puchner, H.K.; Guazzelli, M.A.; Medina, N.H.; Balen, T.R.
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 67(3):518-524 Mar, 2020
Academic Journal
In: Analog Integrated Circuits and Signal Processing . (Analog Integrated Circuits and Signal Processing, August 2022, 112(2):277-287)
Academic Journal
In: Analog Integrated Circuits and Signal Processing . (Analog Integrated Circuits and Signal Processing, September 2021, 108(3):511-524)
Conference
Tambara, L.A.; Kastensmidt, F.L.; C.P.F., E.; Goncalez, O.L.; Balen, T.R.; De Aguirre, P.C.C.; Arruego, I.; Lubaszewski, M.S.
2012 IEEE Radiation Effects Data Workshop Radiation Effects Data Workshop (REDW), 2012 IEEE. :1-6 Jul, 2012
Academic Journal
González, C.J.; Kastensmidt, F.L.; Balen, T.R.; Costa, B.L.; Machado, D.N.; Vaz, R.G.; Gonçalez, O.L.; Puchner, H.; Medina, N.H.; Bôas, A.C.V.; Guazzelli, M.A.
In: Journal of Electronic Testing: Theory and Applications (JETTA) . (Journal of Electronic Testing: Theory and Applications (JETTA), June 2021, 37(3):329-343)
Academic Journal
González, C.J.; Kastensmidt, F.L.; Balen, T.R.; Machado, D.N.; Vaz, R.G.; Gonçalez, O.L.; Vilas Bôas, A.C.; Puchner, H.; Added, N.; Macchione, E.L.A.; Aguiar, V.A.P.; Medina, N.H.; Guazzelli, M.A.
In: Journal of Integrated Circuits and Systems . (Journal of Integrated Circuits and Systems, 2021, 16(3))
Conference
23rd IEEE VLSI Test Symposium (VTS'05) VLSI test symposium VLSI Test Symposium, 2005. Proceedings. 23rd IEEE. :389-394 2005
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[AR] Balen, T.R.
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