학술논문
'학술논문'
에서 검색결과 387건 | 목록
1~10
Conference
Aziza, H.; Postel-Pellerin, J.; Fieback, M.; Hamdioui, S.; Xun, H.; Taouil, M.; Coulie, K.; Rahajandraibe, W.
2024 IEEE 25th Latin American Test Symposium (LATS) Latin American Test Symposium (LATS), 2024 IEEE 25th. :1-5 Apr, 2024
Academic Journal
In Microelectronics Reliability November 2022 138
Academic Journal
Devoge, P.; Aziza, H.; Lorenzini, P.; Masson, P.; Julien, F.; Marzaki, A.; Malherbe, A.; Delalleau, J.; Cabout, T.; Regnier, A.; Niel, S.
In Microelectronics Reliability November 2022 138
Academic Journal
Devoge, P.; Aziza, H.; Lorenzini, P.; Julien, F.; Marzaki, A.; Malherbe, A.; Mantelli, M.; Cabout, T.; Delalleau, J.; Haendler, S.; Regnier, A.; Niel, S.
In Microelectronics Reliability November 2021 126
Academic Journal
In Microelectronics Reliability November 2021 126
Conference
Devoge, P.; Aziza, H.; Lorenzini, P.; Masson, P.; Julien, F.; Marzaki, A.; Malherbe, A.; Delalleau, J.; Cabout, T.; Regnier, A.; Niel, S.
2022 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2022 IEEE International. :1-5 Oct, 2022
Academic Journal
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 22(4):500-505 Dec, 2022
Academic Journal
In Microelectronics Reliability September 2018 88-90:6-10
Conference
2021 IEEE 22nd Latin American Test Symposium (LATS) Latin American Test Symposium (LATS), 2021 IEEE 22nd. :1-5 Oct, 2021
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제한된 항목
[AR] Aziza, H.
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