학술논문
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Conference
Thompson, S.; Anand, N.; Armstrong, M.; Auth, C.; Arcot, B.; Alavi, M.; Bai, P.; Bielefeld, J.; Bigwood, R.; Brandenburg, J.; Buehler, M.; Cea, S.; Chikarmane, V.; Choi, C.; Frankovic, R.; Ghani, T.; Glass, G.; Han, W.; Hoffmann, T.; Hussein, M.; Jacob, P.; Jain, A.; Jan, C.; Joshi, S.; Kenyon, C.; Klaus, J.; Klopcic, S.; Luce, J.; Ma, Z.; Mcintyre, B.; Mistry, K.; Murthy, A.; Nguyen, P.; Pearson, H.; Sandford, T.; Schweinfurth, R.; Shaheed, R.; Sivakumar, S.; Taylor, M.; Tufts, B.; Wallace, C.; Wang, P.; Weber, C.; Bohr, M.
Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :61-64 2002
Conference
Yang, S.; Ahmed, S.; Arcot, B.; Arghavani, R.; Bai, P.; Chambers, S.; Charvat, P.; Cotner, R.; Gasser, R.; Ghani, T.; Hussein, M.; Jan, C.; Kardas, C.; Maiz, J.; McGregor, P.; McIntyre, B.; Nguyen, P.; Packan, P.; Post, I.; Sivakumar, S.; Steigerwald, J.; Taylor, M.; Tufts, B.; Tyagi, S.; Bohr, M.
International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) Electron devices - IEDM 1998 Electron Devices Meeting, 1998. IEDM '98. Technical Digest., International. :197-200 1998
Academic Journal
Clevenger, L.A.; Arcot, B.; Ziegler, W.; Colgan, E. G.; Hong, Q. Z.; d'Heurle, F. M.; Cabral, Jr., C.; Gallo, T. A.; Harper, J. M. E.
Academic Journal
Conference
Thompson, S.; Anand, N.; Armstrong, M.; Auth, C.; Arcot, B.; Alavi, M.; Bai, P.; Bielefeld, J.; Bigwood, R.; Brandenburg, J.; Buehler, M.; Cea, S.; Chikarmane, V.; Choi, C.; Frankovic, R.; Ghani, T.; Glass, G.; Han, W.; Hoffmann, T.; Hussein, M.
Digest. International Electron Devices Meeting; 2002, p61-64, 4p
Academic Journal
Arcot, B.; Ziegler, W.; Hong, Q.Z.; D'Heurle, F.M.; Clevenger, L.A.; Colgan, E.G.; Cabral Jr., C.; Gallo, T.A.; Harper, J.M.E.
In: Journal of Applied Physics . (Journal of Applied Physics, 1 January 1998, 83(1):90-99)
Academic Journal
Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; 1993, Vol. 11 Issue 4, p1435-1440, 6p
Conference
Thompson, S.; Anand, N.; Armstrong, M.; Auth, C.; Arcot, B.; Bai, P.; Bielefeld, J.; Bigwood, R.; Brandenburg, J.; Buehler, M.; Cea, S.; Chikarmane, V.; Choi, C.; Frankovic, R.; Ghani, T.; Glass, G.; Han, W.; Hussein, M.; Jacob, P.; Jain, A.; Jan, C.; Joshi, S.; Kenyon, C.; Klaus, J.; Klopcic, S.; Luce, J.; Ma, Z.; McIntyre, B.; Mistry, K.; Murthy, A.; Nguyen, P.; Pearson, H.; Sandford, T.; Schweinfurth, R.; Sivakumar, S.; Taylor, M.; Tufts, B.; Wallace, C.; Wang, P.; Bohr, M.; Alavi, M.; Hoffmann, T.; Shaheed, R.; Weber, C.
In: Technical Digest - International Electron Devices Meeting . (Technical Digest - International Electron Devices Meeting, 2002, :61-64)
Conference
Yang, S.; Ahmed, S.; Arcot, B.; Arghavani, R.; Bai, P.; Chambers, S.; Charvat, P.; Cotner, R.; Gasser, R.; Ghani, T.; Hussein, M.; Jan, C.; Kardas, C.; Maiz, J.; McGregor, P.
In: Technical Digest - International Electron Devices Meeting . (Technical Digest - International Electron Devices Meeting, 1998, :197-200)
Conference
Clevenger, L.A.; Arcot, B.; Ziegler, W.; Colgan, E.G.; Hong, Q.Z.; d'Heurle, F.M.; Cabral Jr., C.; Gallo, T.A.; Harper, J.M.E.
In: Materials Research Society Symposium - Proceedings , Advanced Metallization for Future ULSI. (Materials Research Society Symposium - Proceedings, 1996, 427:133-139)
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[AR] Arcot, B.
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