학술논문
'학술논문'
에서 검색결과 22건 | 목록
1~10
Academic Journal
Orji, N.G.; Dixson, R.G.; Cresswell, M.W.; Allen, R.A.; Garcia-Gutierrez, D.I.; Bunday, B.D.; Bishop, M.; Allgair, J.A.
In: Journal of Micro/ Nanolithography, MEMS, and MOEMS . (Journal of Micro/ Nanolithography, MEMS, and MOEMS, 1 October 2016, 15(4))
Conference
2007 IEEE International Conference on Microelectronic Test Structures; 2007, p9-13, 5p
Conference
2003 5th International Conference on ASIC. Proceedings (IEEE Cat. No.03TH8690); 2003, p103-106, 4p
Academic Journal
Wang, H.; Laws, G.M.; Milicic, S.; Boland, P.; Handugan, A.; Pratt, M.; Eschrich, T.; Myhajlenko, S.; Allgair, J.A.; Bunday, B.
In: Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures . (Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 2007, 25(1):102-105)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Instrumentation, Metrology, and Standards for Nanomanufacturing III. (Proceedings of SPIE - The International Society for Optical Engineering, 2009, 7405)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Instrumentation, Metrology, and Standards for Nanomanufacturing III. (Proceedings of SPIE - The International Society for Optical Engineering, 2009, 7405:IX)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Instrumentation, Metrology, and Standards for Nanomanufacturing II. (Proceedings of SPIE - The International Society for Optical Engineering, 2008, 7042)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Instrumentation, Metrology, and Standards for Nanomanufacturing. (Proceedings of SPIE - The International Society for Optical Engineering, 2007, 6648:ix)
Conference
Orji, N.G.; Dixson, R.G.; Cresswella, M.W.; Allen, R.A.; Garcia-Gutierrez, D.I.; Bunday, B.D.; Bishop, M.; Allgair, J.A.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXI. (Proceedings of SPIE - The International Society for Optical Engineering, 2007, 6518(PART 1))
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XX. (Proceedings of SPIE - The International Society for Optical Engineering, 2006, 6152 I)
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제한된 항목
[AR] Allgair, J.A.
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