학술논문
'학술논문'
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1~10
Conference
Harms, Professor Chad and Biocca, Professor Frank (2004) Internal Consistency and Reliability of the Networked Minds Measure of Social Presence. [Conference Paper]
Academic Journal
Clemente, Miriam; Rey, Beatriz; Rodriguez-Pujadas, Aina; Breton-Lopez, Juani; Barros-Loscertales, Alfonso; Baños, Rosa M; Botella, Cristina; Alcañiz, Mariano; Avila, Cesar
JMIR Serious Games, Vol 2, Iss 1, p e6 (2014)
Academic Journal
Llanes-Jurado, Jose; Gómez-Zaragozá, Lucía; Minissi, Maria Eleonora; Alcañiz, Mariano; Marín-Morales, Javier
In Expert Systems With Applications 15 July 2024 246
Academic Journal
Cañada, Yolanda; Torres, Sergio C.; Andreu-Martinez, Julia; Cristancho, Diana Beltrán; Chicchi Giglioli, Irene Alice; Garcia-Blanco, Ana; Adriasola, Asier; Navalón, Pablo; Sierra, Pilar; Alcañiz, Mariano
In Journal of Psychiatric Research October 2024 178:349-358
Academic Journal
Minissi, Maria Eleonora; Altozano, Alberto; Marín-Morales, Javier; Chicchi Giglioli, Irene Alice; Mantovani, Fabrizia; Alcañiz, Mariano
In Computers in Biology and Medicine March 2024 171
Academic Journal
Alba-Martínez, Jose; Alcañiz, Mariano; Martínez-Monzó, Javier; Cunha, Luís M.; García-Segovia, Purificación
In Food Research International March 2024 179
Academic Journal
Llanes-Jurado, Jose; Carrasco-Ribelles, Lucía A.; Alcañiz, Mariano; Soria-Olivas, Emilio; Marín-Morales, Javier
In Expert Systems With Applications 15 November 2023 230
Academic Journal
In Journal of Business Research January 2023 154
Conference
Alcaniz, Mariano; Angrisani, Leopoldo; Arpaia, Pasquale; De Benedetto, Egidio; Duraccio, Luigi; Gomez-Zaragoza, Lucia; Marin-Morales, Javier; Minissi, Maria Eleonora
2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), 2023 IEEE International Conference on. :763-768 Oct, 2023
Conference
Valenza, Gaetano; Alcaniz, Mariano; Alfeo, Antonio Luca; Bianchi, Matteo; Carli, Vladimir; Catrambone, Vincenzo; Cimino, Mario CGA; Dudnik, Gabriela; Duggento, Andrea; Ferrante, Matteo; Gentili, Claudio; Guixeres, Jaime; Rossi, Simone; Toschi, Nicola; van Wassenhove, Virginie
2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), 2023 IEEE International Conference on. :757-762 Oct, 2023
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[AR] Alcañiz, Mariano
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