부산대학교 도서관

Ahn H; Ryu J-H

춘계총회 및 학술대회 2000. 1 (2000): 176-177.

Ahn H; Kim YK; Lee HJ; Ko HJ; Kim JY; Ryu JH

춘계총회 및 학술대회 2001. 1 (2001): 210-210.

Ahn H; Suchting R; Woods AJ; Miao H; Green C; Cho RY; Choi E; Fillingim RB

Journal of Pain Research, Vol Volume 11, Pp 2071-2082 (2018)

Paidi AK; PLS-II Beamline Department, Pohang Accelerator Laboratory, POSTECH, Pohang, 37673, Republic of Korea.; Park WB; Department of Printed Electronics Engineering, Sunchon National University, Chonnam, 57922, Republic of Korea.; Paidi VK; European Synchrotron Radiation Facility, 71, Avenue des Martyrs, Grenoble, 38043, France.; Lee J; Faculty of Nanotechnology and Advanced Materials Engineering, Sejong University, Seoul, 05006, Republic of Korea.; Lee KS; PLS-II Beamline Department, Pohang Accelerator Laboratory, POSTECH, Pohang, 37673, Republic of Korea.; Ahn H; PLS-II Beamline Department, Pohang Accelerator Laboratory, POSTECH, Pohang, 37673, Republic of Korea.; Avdeev M; Australian Nuclear Science and Technology Organization (ANSTO), New Illawarra Road, Lucas Heights, New South Wales, 2234, Australia.; Chae KH; Advanced Analysis Center, Korea Institute of Science and Technology, 5 Hwarang-ro 14-gil, Seongbuk-gu, Seoul, 02792, Republic of Korea.; Pyo M; Department of Printed Electronics Engineering, Sunchon National University, Chonnam, 57922, Republic of Korea.; Wu J; College of Chemical and Biological Engineering, Zhejiang University, Hangzhou, Zhejiang, 310027, China.; Sohn KS; Faculty of Nanotechnology and Advanced Materials Engineering, Sejong University, Seoul, 05006, Republic of Korea.; Ahn D; PLS-II Beamline Department, Pohang Accelerator Laboratory, POSTECH, Pohang, 37673, Republic of Korea.; Lu J; College of Chemical and Biological Engineering, Zhejiang University, Hangzhou, Zhejiang, 310027, China.

Publisher: Wiley-VCH Country of Publication: Germany NLM ID: 101235338 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1613-6829 (Electronic) Linking ISSN: 16136810 NLM ISO Abbreviation: Small Subsets: MEDLINE

Ahn H; Department of Anesthesiology and Pain Medicine, Ajou University School of Medicine, Suwon, South Korea.; Chae YJ; Department of Anesthesiology and Pain Medicine, Ajou University School of Medicine, Suwon, South Korea.; Choi GB; Department of Anesthesiology and Pain Medicine, Ajou University School of Medicine, Suwon, South Korea.; Lee MG; Department of Anesthesiology and Pain Medicine, Ajou University School of Medicine, Suwon, South Korea.; Yoo JY; Department of Anesthesiology and Pain Medicine, Ajou University School of Medicine, Suwon, South Korea.

Publisher: International Scientific Information, Inc Country of Publication: United States NLM ID: 9609063 Publication Model: Electronic Cited Medium: Internet ISSN: 1643-3750 (Electronic) Linking ISSN: 12341010 NLM ISO Abbreviation: Med Sci Monit Subsets: MEDLINE

Ahn H; Department of Statistics, Kyungpook National University, Daegu 41566, Republic of Korea.; Lee H; Department of Statistics, Kyungpook National University, Daegu 41566, Republic of Korea.

Publisher: American Institute of Mathematical Sciences;; _b Beihang University Country of Publication: United States NLM ID: 101197794 Publication Model: Print Cited Medium: Internet ISSN: 1551-0018 (Electronic) Linking ISSN: 15471063 NLM ISO Abbreviation: Math Biosci Eng Subsets: MEDLINE

Park I; Department of Oncology, Asian Medical Center, Ulsan University College of Medicine, Seoul, South Korea.; Suh J; Department of Urology, Asian Medical Center, Ulsan University College of Medicine, Seoul, South Korea. Electronic address: uro_jun@amc.seoul.kr.; Lim B; Department of Urology, Asian Medical Center, Ulsan University College of Medicine, Seoul, South Korea.; Song C; Department of Urology, Asian Medical Center, Ulsan University College of Medicine, Seoul, South Korea.; You D; Department of Urology, Asian Medical Center, Ulsan University College of Medicine, Seoul, South Korea.; Jeong IG; Department of Urology, Asian Medical Center, Ulsan University College of Medicine, Seoul, South Korea.; Hong JH; Department of Urology, Asian Medical Center, Ulsan University College of Medicine, Seoul, South Korea.; Ahn H; Department of Urology, Asian Medical Center, Ulsan University College of Medicine, Seoul, South Korea.; Cho YM; Department of Pathology, Asian Medical Center, Ulsan University College of Medicine, Seoul, South Korea.; Lee J; Department of Oncology, Asian Medical Center, Ulsan University College of Medicine, Seoul, South Korea.; Hong B; Department of Urology, Asian Medical Center, Ulsan University College of Medicine, Seoul, South Korea.

Publisher: Elsevier Country of Publication: United States NLM ID: 101260955 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1938-0682 (Electronic) Linking ISSN: 15587673 NLM ISO Abbreviation: Clin Genitourin Cancer Subsets: MEDLINE

Lee T; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, South Korea.; Jung KS; Flash Memory Technology Design Team, Samsung Electronics Co. Ltd., Giheung, 17113, South Korea.; Department of Semiconductor and Display Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, South Korea.; Seo S; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, South Korea.; Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, 34141, South Korea.; Research Laboratory of Electronics, Massachusetts Institute of Technology (MIT), Cambridge, MA, 02138, USA.; Lee J; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, South Korea.; Park J; Department of Electrical Engineering, Pohang University of Science and Technology (POSTECH), Pohang, 37673, South Korea.; Kang S; Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, 34141, South Korea.; Park J; Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, 34141, South Korea.; Kang J; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, South Korea.; Ahn H; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, South Korea.; Kim S; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, South Korea.; Lee HW; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology (MIT), Cambridge, MA, 02138, USA.; Lee D; Research Laboratory of Electronics, Massachusetts Institute of Technology (MIT), Cambridge, MA, 02138, USA.; Department of Mechanical Engineering, Massachusetts Institute of Technology (MIT), Cambridge, MA, 02138, USA.; Kim KS; Research Laboratory of Electronics, Massachusetts Institute of Technology (MIT), Cambridge, MA, 02138, USA.; Department of Mechanical Engineering, Massachusetts Institute of Technology (MIT), Cambridge, MA, 02138, USA.; Kim H; Research Laboratory of Electronics, Massachusetts Institute of Technology (MIT), Cambridge, MA, 02138, USA.; Department of Mechanical Engineering, Massachusetts Institute of Technology (MIT), Cambridge, MA, 02138, USA.; Department of Electrical and Computer Engineering, University of Illinois Urbana-Champaign (UIUC), Urbana, IL, 61801, USA.; Nick Holonyak, Jr. Micro and Nanotechnology Laboratory, University of Illinois Urbana-Champaign (UIUC), Urbana, IL, 61801, USA.; Heo K; School of Semiconductor Science & Technology, Jeonbuk National University, Jeonju, 54896, South Korea.; Kim S; School of Electronics Engineering College of IT Engineering, Kyungpook National University, Daegu, 41566, South Korea.; Bae SH; Department of Mechanical Engineering and Materials Science, Washington University in Saint Louis, Missouri, MO, 63130, USA.; Institute of Materials Science and Engineering, Washington University in Saint Louis, Missouri, MO, 63130, USA.; Kang S; Department of Electrical Engineering, Pohang University of Science and Technology (POSTECH), Pohang, 37673, South Korea.; Kang K; Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, 34141, South Korea.; Graduate School of Semiconductor Technology, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, 34141, South Korea.; Kim J; Research Laboratory of Electronics, Massachusetts Institute of Technology (MIT), Cambridge, MA, 02138, USA.; Department of Mechanical Engineering, Massachusetts Institute of Technology (MIT), Cambridge, MA, 02138, USA.; Park JH; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, South Korea.

Publisher: Wiley-VCH Country of Publication: Germany NLM ID: 9885358 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1521-4095 (Electronic) Linking ISSN: 09359648 NLM ISO Abbreviation: Adv Mater Subsets: PubMed not MEDLINE; MEDLINE

Jo H; Center for Nanotectonics, Department of Chemistry and KI for the NanoCentury, KAIST, Daejeon 34141, Korea. sangwoohan@kaist.ac.kr.; Wy Y; Center for Nanotectonics, Department of Chemistry and KI for the NanoCentury, KAIST, Daejeon 34141, Korea. sangwoohan@kaist.ac.kr.; Ahn H; Center for Nanotectonics, Department of Chemistry and KI for the NanoCentury, KAIST, Daejeon 34141, Korea. sangwoohan@kaist.ac.kr.; Kim Y; Center for Nanotectonics, Department of Chemistry and KI for the NanoCentury, KAIST, Daejeon 34141, Korea. sangwoohan@kaist.ac.kr.; Goo BS; Center for Nanotectonics, Department of Chemistry and KI for the NanoCentury, KAIST, Daejeon 34141, Korea. sangwoohan@kaist.ac.kr.; Kwon Y; Center for Nanotectonics, Department of Chemistry and KI for the NanoCentury, KAIST, Daejeon 34141, Korea. sangwoohan@kaist.ac.kr.; Kim JH; Department of Physics, Konkuk University, Seoul 05029, Korea.; Choi JS; Department of Physics, Konkuk University, Seoul 05029, Korea.; Han SW; Center for Nanotectonics, Department of Chemistry and KI for the NanoCentury, KAIST, Daejeon 34141, Korea. sangwoohan@kaist.ac.kr.

Publisher: RSC Pub Country of Publication: England NLM ID: 101525249 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 2040-3372 (Electronic) Linking ISSN: 20403364 NLM ISO Abbreviation: Nanoscale Subsets: MEDLINE

Go E; Advanced Photovoltaics Research Center, Korea Institute of Science and Technology (KIST), Seoul 02792, Republic of Korea.; Graduate School of Energy and Environment (KU-KIST GREEN SCHOOL), Korea University, Seoul 02841, Republic of Korea.; Jin H; Advanced Photovoltaics Research Center, Korea Institute of Science and Technology (KIST), Seoul 02792, Republic of Korea.; Graduate School of Energy and Environment (KU-KIST GREEN SCHOOL), Korea University, Seoul 02841, Republic of Korea.; Yoon S; Advanced Photovoltaics Research Center, Korea Institute of Science and Technology (KIST), Seoul 02792, Republic of Korea.; Ahn H; Pohang Accelerator Laboratory, Pohang University of Science and Technology (POSTECH), Pohang 37673, Republic of Korea.; Kim J; Department of Energy Science, Sungkyunkwan University, Suwon 16419, Republic of Korea.; Lim C; Advanced Photovoltaics Research Center, Korea Institute of Science and Technology (KIST), Seoul 02792, Republic of Korea.; Kim JH; Department of Energy Science, Sungkyunkwan University, Suwon 16419, Republic of Korea.; Department of Physics, Pusan National University, Busan 46241, Republic of Korea.; Din HU; Computational Science Research Center, KIST, Seoul 02792, Republic of Korea.; Lee JH; Computational Science Research Center, KIST, Seoul 02792, Republic of Korea.; Jun Y; Graduate School of Energy and Environment (KU-KIST GREEN SCHOOL), Korea University, Seoul 02841, Republic of Korea.; Yu H; Advanced Photovoltaics Research Center, Korea Institute of Science and Technology (KIST), Seoul 02792, Republic of Korea.; Nanoscience and Technology, KIST School, University of Science and Technology, Seoul 02792, Republic of Korea.; Son HJ; Advanced Photovoltaics Research Center, Korea Institute of Science and Technology (KIST), Seoul 02792, Republic of Korea.; Graduate School of Energy and Environment (KU-KIST GREEN SCHOOL), Korea University, Seoul 02841, Republic of Korea.

Publisher: American Chemical Society Country of Publication: United States NLM ID: 7503056 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1520-5126 (Electronic) Linking ISSN: 00027863 NLM ISO Abbreviation: J Am Chem Soc Subsets: PubMed not MEDLINE; MEDLINE