학술논문
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Academic Journal
Rao, R.A.; Gasquet, H.P.; Steimle, R.F.; Rinkenberger, G.; Straub, S.; Muralidhar, R.; Anderson, S.G.H.; Yater, J.A.; Ledezma, J.C.; Hamilton, J.; Acred, B.; Swift, C.T.; Hradsky, B.; Peschke, J.; Sadd, M.; Prinz, E.J.; Chang, K.M.; White, B.E., Jr.
In Solid State Electronics 2005 49(11):1722-1727
Conference
Muralidhar, R.; Steimle, R.F.; Sadd, M.; Rao, R.; Swift, C.T.; Prinz, E.J.; Yater, J.; Grieve, L.; Harber, K.; Hradsky, B.; Straub, S.; Acred, B.; Paulson, W.; Chen, W.; Parker, L.; Anderson, S.G.H.; Rossow, M.; Merchant, T.; Paransky, M.; Huynh, T.; Hadad, D.; Ko-Min Chang; White, B.E., Jr.
2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866) Integrated circuit design and technology Integrated Circuit Design and Technology, 2004. ICICDT '04. International Conference on. :31-35 2004
Conference
Steimle, R.F.; Rao, R.; Sadd, M.; Swift, C.; Hradsky, B.; Straub, S.; Merchant, T.; Stoker, M.; Parikh, C.; Anderson, S.; Rossow, M.; Yater, J.; Acred, B.; Harber, K.; Prinz, E.; White, B.E., Jr.; Muralidhar, R.
4th IEEE Conference on Nanotechnology, 2004. Nanotechnology Nanotechnology, 2004. 4th IEEE Conference on. :290-292 2004
Conference
Hradsky, B.; Muralidhar, R.; Rao, R.A.; Steimle, B.; Straub, S.; White, B.E., Jr.; Sadd, M.; Anderson, S.G.H.; Yater, J.A.; Swift, C.T.; Acred, B.; Peschke, J.; Prinz, E.J.; Chang, K.M.
63rd Device Research Conference Digest, 2005. DRC '05. Device Research Conference Digest, 2005. DRC '05. 63rd. 1:37-38 2005
Conference
Muralidhar, R.; Steimle, R.F.; Sadd, M.; Rao, R.; Swift, C.T.; Prinz, E.J.; Yater, J.; Grieve, L.; Harber, K.; Hradsky, B.; Straub, S.; Acred, B.; Paulson, W.; Chen, W.; Parker, L.; Anderson, S.G.H.; Rossow, M.; Merchant, T.; Paransky, M.; Huynh, T.; Hadad, D.; Ko-Min Chang; White, B.E., Jr.
IEEE International Electron Devices Meeting 2003 Electron devices IEDM'03 Electron Devices Meeting, 2003. IEDM '03 Technical Digest. IEEE International. :26.2.1-26.2.4 2003
Academic Journal
Steimle, R.F.; Muralidhar, R.; Rao, R.; Sadd, M.; Swift, C.T.; Yater, J.; Hradsky, B.; Straub, S.; Gasquet, H.; Vishnubhotla, L.; Prinz, E.J.; Merchant, T.; Acred, B.; Chang, K.; White Jr., B.E.
In: Microelectronics Reliability . (Microelectronics Reliability, April 2007, 47 4-5 SPEC. ISS.:585-592)
Academic Journal
Rao, R.A.; Steimle, R.F.; Sadd, M.; Swift, C.T.; Hradsky, B.; Straub, S.; Merchant, T.; Stoker, M.; Anderson, S.G.H.; Rossow, M.; Yater, J.; Acred, B.; Harber, K.; Prinz, E.J.; White Jr., B.E.; Muralidhar, R.
Conference
Muralidhar, R.; Steimle, R.F.; Sadd, M.; Rao, R.; Swift, C.T.; Prinz, E.J.; Yater, J.; Grieve, L.; Harber, K.; Hradsky, B.; Straub, S.; Acred, B.; Paulson, W.; Chen, W.; Parker, L.; Anderson, S.G.H.; Rossow, M.; Merchant, T.; Paransky, M.; Huynh, T.; Hadad, D.; Chang, K.-M.; White Jr., B.E.
In: Technical Digest - International Electron Devices Meeting . (Technical Digest - International Electron Devices Meeting, 2003, :601-604)
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[AR] Acred, B.
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