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Academic Journal
Zhang, Y.; Zhang, D.W.; Bian, Y.; Liu, B.; Zhang, C.; Huang, J.; Song, J.; Gao, Y.; Zhou, Q.; Chen, W.; Xiao, S.; Nissim, S.B.; Houchens, K.; Baum, O.; Zakay, A.; Ayzik, T.; Abramovitz, Y.
In: Journal of Micro/Nanopatterning, Materials and Metrology . (Journal of Micro/Nanopatterning, Materials and Metrology, 1 October 2022, 21(4))
Academic Journal
Moussa, A.; Bogdanowicz, J.; Groven, B.; Morin, P.; Beggiato, M.; Saib, M.; Santoro, G.; Abramovitz, Y.; Houchens, K.; Ben Nissim, S.; Meir, N.; Hung, J.; Urbanowicz, A.; Koret, R.; Turovets, I.; Lee, B.; Lee, W. T.; Lorusso, G. F.; Charley, A. -L.
Periodical
Robinson, John C.; Sendelbach, Matthew J.; Moussa, A.; Bogdanowicz, J.; Groven, B.; Morin, P.; Beggiato, M.; Saib, M.; Santoro, G.; Abramovitz, Y.; Houtchens, K.; Ben Nissim, S.; Meir, N.; Hung, J.; Urbanowicz, A.; Koret, R.; Turovets, I.; Lorusso, G. F.; Charley, A.-L.
Proceedings of SPIE; April 2023, Vol. 12496 Issue: 1 p124961X-124961X-7, 1124657p
Academic Journal
Bar, D. E.; Wolowelsky, K.; Swirski, Y.; Figov, Z.; Michaeli, A.; Vaynzof, Y.; Abramovitz, Y.; Ben-Dov, A.; Yaron, O.; Weizman, L.; Adar, R.
IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 10(3):707-711 Mar, 2010
Conference
Moussa, A.; Bogdanowicz, J.; Groven, B.; Morin, P.; Beggiato, M.; Saib, M.; Lorusso, G.F.; Charley, A.-L.; Santoro, G.; Abramovitz, Y.; Houchens, K.; Nissim, S.B.; Meir, N.; Hung, J.; Urbanowicz, A.; Koret, R.; Turovets, I.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control XXXVII. (Proceedings of SPIE - The International Society for Optical Engineering, 2023, 12496)
Conference
Jo, S.; Kim, J.; Park, Y.; Lee, M.; Park, J.; Park, C.; Yeo, J.-H.; Abramovitz, Y.; Kim, Y.J.; Shoham, A.; Nissim, S.B.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control XXXVII. (Proceedings of SPIE - The International Society for Optical Engineering, 2023, 12496)
Conference
Pal, A.; Thareja, G.; Dag, S.; Costrini, G.; Reddy, V.; Xu, Y.; Lei, Y.; Zhang, A.; Shen, G.; Jansen, A.; Chen, Z.; Gage, M.; Tang, J.; Yang, Y.-C.; Deshpande, S.; Huey, S.; Hung, R.; Jiang, H.; Cai, M.-P.; Abramovitz, Y.; Engel, L.; Naik, M.; Wang, R.; Kesapragada, S.; Ayyagari-Sangamalli, B.; Tang, X.; Bazizi, E.M.
In: Technical Digest - International Electron Devices Meeting, IEDM , 2022 International Electron Devices Meeting, IEDM 2022. (Technical Digest - International Electron Devices Meeting, IEDM, 2022, 2022-December:1261-1264)
Conference
Santoro, G.; Cockburn, A.; Houchens, K.; Elizov, M.; Yaron, L.; Chemama, M.; Goldenshtein, A.; Zakay, A.; Amit, N.; Abramovitz, Y.; Tam, A.; Adan, O.; Bogdanowicz, J.; Briggs, B.; Pacco, A.; Hody, H.; Delhougne, R.; Mertens, H.; Charley, A.-L.; Horiguchi, N.; Leray, P.; Lorusso, G.F.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control XXXVI. (Proceedings of SPIE - The International Society for Optical Engineering, 2022, 12053)
Academic Journal
In: Journal of Creativity in Mental Health . (Journal of Creativity in Mental Health, 2 January 2016, 11(1):12-26)
Conference
Abramovitz, Y.; Sarig, L.; Levin, G.; Levi, S.; Davidescu, R.; Harel, D.; Adan, O.; Leray, P.; Halder, S.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXXIV. (Proceedings of SPIE - The International Society for Optical Engineering, 2020, 11325)
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제한된 항목
[AR] Abramovitz, Y.
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