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A new approach in feature interaction testing

Document Type

Journal

Author

Nakamura, M; Kikuno, T

Source

INTEGRATION-THE VLSI JOURNAL; DEC 1998, 26 1-2, p211-p223, 13p.

Subject

Language

English

ISSN

01679260

Online Access

Full Text (ScienceDirect 종량제) Web of Science JCR 저널정보 Scopus Find it@PNU

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