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Correlating Interface and Border Traps WithDistinctive Features of C-V Curves in Vertical Al2O3/GaN MOS Capacitors

Document Type

Journal

Author

Zagni, Nicolo; Fregolent, Manuel; Verzellesi, Giovanni; Marcuzzi, Alberto; De Santi, Carlo; Meneghesso, Gaudenzio; Zanoni, Enrico; Treidel, Eldad Bahat; Brusaterra, Enrico; Brunner, Frank; Hilt, Oliver; Meneghini, Matteo; Pavan, Paolo

Source

IEEE TRANSACTIONS ON ELECTRON DEVICES; NOV 27 2023, 6p.

Subject

Language

English

ISSN

15579646

Online Access

Full Text (IEEE) Web of Science JCR 저널정보 Scopus Find it@PNU

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