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Substrate removal and BOX thinning effects on total dose response of FDSOI NMOSFET

Document Type

Journal

Author

Gouker, P; Burns, J; Wyatt, P; Warner, K; Austin, E; Milanowski, R

Source

IEEE TRANSACTIONS ON NUCLEAR SCIENCE; DEC 2003, 50 6, p1776-p1783, 8p.

Subject

Language

English

ISSN

15581578

Online Access

Full Text (IEEE) Web of Science JCR 저널정보 Scopus Find it@PNU

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