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Application of Raman microscopy to the analysis of silicon carbide monofilaments

Document Type

Journal

Author

Ward, Y; Young, RJ; Shatwell, RA

Source

JOURNAL OF MATERIALS SCIENCE; NOV 15 2004, 39 22, p6781-p6790, 10p.

Subject

Language

English

ISSN

00222461

Online Access

EBSCOHost PDF Full Text (Springer-Archive) Full Text (ProQuest Central) Web of Science JCR 저널정보 Scopus Find it@PNU

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