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Measurement of piezoelectric field and tunneling times in strongly biased InGaN/GaN quantum wells

Document Type

Journal

Author

Jho, YD; Yahng, JS; Oh, E; Kim, DS

Source

APPLIED PHYSICS LETTERS; AUG 20 2001, 79 8, p1130-p1132, 3p.

Subject

Language

English

ISSN

00036951

Online Access

Full Text (AIP) Web of Science JCR 저널정보 Scopus Find it@PNU

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