학술논문
TEST BEAM RESULTS FROM THE PROTOTYPE L3 SILICON MICROVERTEX DETECTOR
Document Type
Journal
Author
ADAM, A; ADRIANI, O; AHLEN, S; AMBROSI, G; BABUCCI, E; BAKSAY, L; BASCHIROTTO, A; BATTISTON, R; BAY, A; BENCZE, GL; BERTUCCI, B; BIASINI, M; BILEI, GM; BOBBINK, GJ; BOSETTI, M; BROOKS, ML; BURGER, WJ; BUSENITZ, J; CAMPS, C; CARIA, M; CASTELLINI, G; CASTELLO, R; CHECCUCCI, B; CHEN, A; COAN, TE; COMMICHAU, V; DIBITONTO, D; DUINKER, P; EASO, S; EXTERMANN, P; FIANDRINI, E; GABBANINI, A; GOUGAS, A; HANGARTER, K; HAUVILLER, C; HERVE, A; HU, G; JOSA, MI; KAPUSTINSKY, JS; KIM, D; KINNISON, WW; KORNIS, J; KRASTEV, VR; LANDI, G; LEBEAU, M; LEE, DM; LEISTE, R; LIN, W; LOHMANN, W; MARIN, A; MASSETTI, R; MATAY, G; MILLS, GB; NOWAK, H; PASSALEVA, G; PAUL, T; PAULUZZI, M; PENSOTTI, S; PERRIN, E; RANCOITA, PG; RATTAGGI, M; ROSCH, A; SANTOCCHIA, A; SIEDLING, R; SACHWITZ, M; SCHMITZ, P; SCHONEICH, B; SERVOLI, L; SUSINNO, GF; TERZI, G; TESI, M; TONISCH, F; TOTH, J; TROWITZSCH, G; VIERTEL, G; VOGT, H; WALDMEIER, S; WEGMANN, J; WEILL, R; XU, J; YEH, SC; ZHOU, B
Source
Subject
Language
English
ISSN
18729576