학술논문

Extremely Low On-Resistance and High Breakdown Voltage Observed in Vertical GaN Schottky Barrier Diodes with High-Mobility Drift Layers on Low-Dislocation-Density GaN Substrates
Document Type
Journal
Source
APPLIED PHYSICS EXPRESS; AUG 2010, 3 8, p081001 3p.
Subject
Language
English
ISSN
18820778