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A study of hot-hole injection during programming drain disturb in flash memories

Document Type

Journal

Author

Ielmini, D; Ghetti, A; Spinelli, AS; Visconti, A

Source

IEEE TRANSACTIONS ON ELECTRON DEVICES; APR 2006, 53 4, p668-p676, 9p.

Subject

Language

English

ISSN

00189383

Online Access

Full Text (IEEE) Web of Science JCR 저널정보 Scopus Find it@PNU

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