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Interfacial analysis using time-of-flight medium energy backscattering

Document Type

Journal

Author

Geil, RD; Rogers, BR; Song, Z; Weller, RA

Source

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A; JUL-AUG 2004, 22 4, p1129-p1133, 5p.

Subject

Language

English

ISSN

07342101

Online Access

Full Text (AIP) Web of Science JCR 저널정보 Scopus Find it@PNU

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