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Local structural analysis of In-doped Bi2Se3 topological insulator using X-ray fluorescence holography

Document Type

Journal

Author

Kimura, Koji; Hayashi, Koichi; Yashina, Lada V.; Happo, Naohisa; Nishioka, Takumi; Yamamoto, Yuta; Ebisu, Yoshihiro; Ozaki, Toru; Hosokawa, Shinya; Matsushita, Tomohiro; Tajiri, Hiroo

Source

SURFACE AND INTERFACE ANALYSIS; JAN 2019, 51 1, p51-p55, 5p.

Subject

Language

English

ISSN

10969918

Online Access

Full Text (Wiley Journals) Full Text (Wiley-DB) Web of Science JCR 저널정보 Scopus Find it@PNU

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