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Short-channel radiation effect in 60 MeV proton irradiated 0.13 mu m CMOS transistors

Document Type

Journal

Author

Simoen, E; Mercha, A; Morata, A; Hayama, K; Richardson, G; Rafi, JM; Augendre, E; Claeys, C; Mohammadzadeh, A; Ohyama, H; Romano-Rodriguez, A

Source

IEEE TRANSACTIONS ON NUCLEAR SCIENCE; DEC 2003, 50 6, p2426-p2432, 7p.

Subject

Language

English

ISSN

00189499

Online Access

Full Text (IEEE) Web of Science JCR 저널정보 Scopus Find it@PNU

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