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All-silicon optical contactless testing of integrated circuits

Document Type

Journal

Author

Sayil, S; Kerns, D; Kerns, S

Source

INTERNATIONAL JOURNAL OF ELECTRONICS; JUL 2002, 89 7, p537-p547, 11p.

Subject

Language

English

ISSN

00207217

Online Access

Web of Science JCR 저널정보 Scopus Find it@PNU

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