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Real-to-virtual transition in bulk GaAs: the thickness dependence

Document Type

Journal

Author

Jho, YD; Lee, JY; Yahng, JS; Yee, KJ; Hohng, SC; Kim, DS; Lim, KS

Source

JOURNAL OF THE KOREAN PHYSICAL SOCIETY; NOV 2000, 37 5, p728-p734, 7p.

Subject

Language

English

ISSN

03744884

Online Access

Web of Science JCR 저널정보 Scopus Find it@PNU

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