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Effects of plasma process induced damages on organic gate dielectrics of organic thin-film transistors

Document Type

Journal

Author

Kim, Doo-Hyun; Kim, Dong-Woo; Kim, Keon-Soo; Kim, Hyoung-Jin; Moon, Ji-Sin; Hong, Mun-Pyo; Kim, Bo-Sung; Shin, Jung-Han; Kim, Young-Min; Song, Keun-Kyu; Shin, Seong-Sik

Source

JAPANESE JOURNAL OF APPLIED PHYSICS; JUL 2008, 47 7, p5672-p5675, 4p.

Subject

Language

English

ISSN

00214922

Online Access

Full Text (IOP) Web of Science JCR 저널정보 Scopus Find it@PNU

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