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Accurate charge-control model for analysis of noise properties for AlGaAs/GaAs HEMT and AlGaAs/InGaAs PHEMT at microwave frequencies

Document Type

Journal

Author

Guru, V; Vyas, HP; Gupta, M; Gupta, RS

Source

MICROWAVE AND OPTICAL TECHNOLOGY LETTERS; SEP 20 2004, 42 6, p489-p494, 6p.

Subject

Language

English

ISSN

08952477

Online Access

Full Text (Wiley Journals) Full Text (Wiley-DB) Web of Science JCR 저널정보 Scopus Find it@PNU

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