학술논문

A 6-GHz 16-kB L1 cache in a 100-nm dual-V-T technology using a bitline leakage reduction (BLR) technique
Document Type
Journal
Source
IEEE JOURNAL OF SOLID-STATE CIRCUITS; MAY 2003, 38 5, p839-p842, 4p.
Subject
Language
English
ISSN
1558173X