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Investigation of structure and properties of nanocrystalline silicon on various buffer layers

Document Type

Journal

Author

Lin, CY; Fang, YK; Chen, SF; Lin, CS; Chou, TH; Hwang, SB; Hwang, JS; Lin, KI

Source

JOURNAL OF ELECTRONIC MATERIALS; AUG 2005, 34 8, p1123-p1128, 6p.

Subject

Language

English

ISSN

1543186X

Online Access

Full Text (Springer-Archive) Full Text (ProQuest Central) Web of Science JCR 저널정보 Scopus Find it@PNU

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