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Investigation of Low-Frequency Noise Characterization of 28-nm High-k pMOSFET with Embedded SiGe Source/Drain

Document Type

Journal

Author

Tsai, Shih-Chang; Wu, San-Lein; Chen, Jone-Fang; Wang, Bo-Chin; Huang, Po Chin; Tsai, Kai-Shiang; Kao, Tsung-Hsien; Yang, Chih-Wei; Chen, Cheng-Guo; Lo, Kun-Yuan; Cheng, Osbert; Fang, Yean-Kuen

Source

JOURNAL OF NANOMATERIALS; 2014, p787132 6p.

Subject

Language

English

ISSN

16874129

Online Access

EBSCOHost PDF Full Text (ProQuest Central) Web of Science JCR 저널정보 Scopus Find it@PNU

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