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Logarithmic trapping and detrapping in beta-Ga2O3 MOSFETs: Experimental analysis and modeling

Document Type

Journal

Author

Fregolent, Manuel; Brusaterra, Enrico; De Santi, Carlo; Tetzner, Kornelius; Wuerfl, Joachim; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo

Source

APPLIED PHYSICS LETTERS; APR 18 2022, 120 16, p163502 5p.

Subject

Language

English

ISSN

10773118

Online Access

Full Text (AIP) Web of Science JCR 저널정보 Scopus Find it@PNU

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