학술논문
Robustness test of a system of MSGC plus GEM detectors at the cyclotron facility of the Paul Scherrer institute
Document Type
Journal
Author
Ageron, M; Albert, A; Barvich, T; Beaumont, W; Beckers, T; Bernier, K; Blum, P; Bouhali, O; Boulogne, I; Bouvet, D; Brom, JM; Charles, F; Coffin, J; Contardo, D; Daubie, E; Didierjean, F; Erdmann, M; De Lentdecker, G; Devroede, O; De Troy, J; Ernenwein, JP; Fahrer, M; Flugge, G; Fontaine, JC; Geist, W; Goerlach, U; Gottschalk, M; Helleboid, JM; Huss, D; Iacopi, F; Karcher, K; Kuhn, F; Juillot, P; Lounis, A; Maazouzi, C; Macke, D; Martin, C; Mirabito, L; Moreau, S; Muller, T; Neuberger, D; Nowack, A; Perries, S; Ripp-Baudot, I; Roderer, F; Schulte, R; Shekhtman, L; Simonis, HJ; Struczinski, W; Tatarinov, A; Thummel, WH; Udo, F; Van Doninck, W; Van Dyck, C; Vander Velde, C; Vanlaer, P; Van Lancker, L; Weiler, T; Zander, A; Zghiche, A; Zhukov, V
Source
Subject
Language
English
ISSN
18729576