학술논문
Single Fault Diagnostic Tests for Inversion Faults of Circuit Elements Over Some Bases
Document Type
Original Paper
Author
Source
Computational Mathematics and Modeling. 30(1):36-47
Subject
Language
English
ISSN
1046-283X
1573-837X
1573-837X
Abstract
The article shows that, in a number of bases, every Boolean function can be realized by an irredundant combinational circuit that admits a single fault diagnostic test of length not greater than 4 with respect to inversion faults on the element outputs.