학술논문

Thickness Effect on Properties of Sprayed In2S3 Films for Photovoltaic Applications
Document Type
Original Paper
Source
Journal of Electronic Materials. January 2016 45(1):829-838
Subject
In2S3 films
spray
thickness
structure
morphology
optical constants
Language
English
ISSN
0361-5235
1543-186X
Abstract
Indium sulfide (In2S3) films have been deposited on soda-lime glass substrates using a spray technique (CSP). Indium chloride and thiourea were used as precursors at a molar ratio of S:In = 2. The substrate temperature was fixed at 340°C. The effect of film thickness on the structural, morphological and optical properties of the as-deposited films has been studied. These films were characterized by x-ray diffraction, scanning electron microscopy (SEM), atomic force microscopy (AFM) and optical absorption spectroscopy. As-prepared samples were polycrystalline with a cubic structure and (400) as preferential orientation. Their grain size increased from 35 nm to 41 nm with increasing thickness whereas the dislocation density and microstrain of the films decreased with the increase of thickness. Both SEM and AFM images showed that the films were homogenous with an increase of the surface roughness with the increase of thickness. The optical transmittance of the films decreased from 80% to 20% in the visible and infrared regions when the thickness was increased from 0.78 μm to 6.09 μm. The optical band gap Eg was found to be in the range of 2.75–2.19 eV and showed a decrease with film thickness. Based on the measured optical constants (n and k), a Wemple–Didomenico model was used to determine the values of single oscillator energy (E0), dispersion energy (Ed), optical band gap (Eg) and high frequency dielectric constant (ε∞). In addition, these films exhibited n-type conductivity and were highly resistive. These results confirm that In2S3 thin films are a promising alternative as a buffer-layer material for CuInGa(S,Se)2-based solar cells.