학술논문
Micron-scale phenomena observed in a turbulent laser-produced plasma
Document Type
Original Paper
Author
Rigon, G.; Albertazzi, B.; Pikuz, T.; Mabey, P.; Bouffetier, V.; Ozaki, N.; Vinci, T.; Barbato, F.; Falize, E.; Inubushi, Y.; Kamimura, N.; Katagiri, K.; Makarov, S.; Manuel, M. J.-E.; Miyanishi, K.; Pikuz, S.; Poujade, O.; Sueda, K.; Togashi, T.; Umeda, Y.; Yabashi, M.; Yabuuchi, T.; Gregori, G.; Kodama, R.; Casner, A.; Koenig, M.
Source
Nature Communications. 12(1)
Subject
Language
English
ISSN
2041-1723
Abstract
Turbulence is ubiquitous in the universe and in fluid dynamics. It influences a wide range of high energy density systems, from inertial confinement fusion to astrophysical-object evolution. Understanding this phenomenon is crucial, however, due to limitations in experimental and numerical methods in plasma systems, a complete description of the turbulent spectrum is still lacking. Here, we present the measurement of a turbulent spectrum down to micron scale in a laser-plasma experiment. We use an experimental platform, which couples a high power optical laser, an x-ray free-electron laser and a lithium fluoride crystal, to study the dynamics of a plasma flow with micrometric resolution (~1μm) over a large field of view (>1 mm2 ). After the evolution of a Rayleigh–Taylor unstable system, we obtain spectra, which are overall consistent with existing turbulent theory, but present unexpected features. This work paves the way towards a better understanding of numerous systems, as it allows the direct comparison of experimental results, theory and numerical simulations.
Turbulence effects explored use macroscale systems in general. Here the authors generate a turbulent plasma using laser irradiation of a solid target and study the dynamics of the plasma flow at the micron-scale by using scattering of an XFEL beam.
Turbulence effects explored use macroscale systems in general. Here the authors generate a turbulent plasma using laser irradiation of a solid target and study the dynamics of the plasma flow at the micron-scale by using scattering of an XFEL beam.