학술논문
Statistically meaningful data on the chemical state of iron precipitates in processed multicrystalline silicon using synchrotron-based X-ray absorption spectroscopy
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Abstract
X-ray fluorescence microscopy (mu-XRF), x-ray beam induced current (XBIC), and x-ray absorption spectromicroscopy (mu-XAS) were performed on fully-processed BaySix cast multicrystalline silicon and aluminum-gettered AstroPower Silicon-Film(TM) sheet material. Over ten iron precipitates--predominantly of iron silicide--were identified at low lifetime regions in both materials, both at grain boundaries and intragranular defects identified by XBIC. In addition, large (micron-sized) particles containing oxidized iron and other impurities (Ca, Cr, Mn) were found in BaySix material. The smaller iron silicide precipitates were more numerous and spatially distributed than their larger oxidized iron counterparts, and thus deemed more detrimental to minority carrier diffusion length.