학술논문
Open Lead Detection Based on Logical Change Caused by AC Voltage Signal Stimulus
Document Type
Conference
Source
ITC-CSCC :International Technical Conference on Circuits Systems, Computers and Communications. 2008-07 2008(7):241-244
Subject
Language
Korean
Abstract
In this paper, we propose a new test method for detecting an open lead which occurs when an IC is mounted on a printed circuit board. In the method, an open lead is detected by observing output logical change of an open lead detector. Since the test method is a vectorless test one, test generation and test input application are not needed. Testability of the test method is examined by some experiments. The results show that open leads of SSIs and LSIs will be detected by the method.