학술논문

A qualitative study on identity in individuals at clinical high risk for psychosis: ' … Why does it have to be one thing?'.
Document Type
Journal Article
Author
Sarac, Cansu, ORCID 0000-0003-3819-5918. Department of Psychiatry, Icahn School of Medicine at Mount Sinai, New York, NY, US; DeLuca, Joseph S., ORCID 0000-0002-5958-7219. Department of Psychiatry, Icahn School of Medicine at Mount Sinai, New York, NY, US, joseph.deluca@mssm.edu; Bilgrami, Zarina R., ORCID 0000-0002-5996-415X. Department of Psychiatry, Icahn School of Medicine at Mount Sinai, New York, NY, US; Herrera, Shaynna N., ORCID 0000-0002-8295-4515. Department of Psychiatry, Icahn School of Medicine at Mount Sinai, New York, NY, US; Myers, Jonathan J.. Department of Psychiatry, Icahn School of Medicine at Mount Sinai, New York, NY, US; Dobbs, Matthew F.. Department of Psychiatry, Icahn School of Medicine at Mount Sinai, New York, NY, US; Haas, Shalaila S., ORCID 0000-0003-1385-1050. Department of Psychiatry, Icahn School of Medicine at Mount Sinai, New York, NY, US; Todd, Therese L., ORCID 0000-0002-1021-290X. Department of Psychiatry, Icahn School of Medicine at Mount Sinai, New York, NY, US; Srivastava, Agrima. Department of Psychiatry, Icahn School of Medicine at Mount Sinai, New York, NY, US; Jespersen, Rachel. Department of Psychiatry, Icahn School of Medicine at Mount Sinai, New York, NY, US; Shaik, Riaz B.. Department of Psychiatry, Icahn School of Medicine at Mount Sinai, New York, NY, US; Landa, Yulia. Department of Psychiatry, Icahn School of Medicine at Mount Sinai, New York, NY, US; Davidson, Larry. Department of Psychiatry, Yale University School of Medicine, New Haven, CT, US; Pavlo, Anthony J.. Department of Psychiatry, Yale University School of Medicine, New Haven, CT, US; Corcoran, Cheryl M.. Department of Psychiatry, Icahn School of Medicine at Mount Sinai, New York, NY, US
Source
Psychiatric Rehabilitation Journal, Vol 45(1), Mar, 2022. pp. 44-53.
Subject
*At Risk Populations; *Psychosis; *Self-Concept; Intervention
Language
English
ISSN
1095-158X (Print)
1559-3126 (Electronic)