학술논문
Atomic Force Microscope for Imaging and Spectroscopy
Document Type
Report
Author
Source
Concepts and Approaches for Mars Exploration. (Part 2)
Subject
Language
English
Abstract
We have developed, built, and tested an atomic force microscope (AFM) for extraterrestrial applications incorporating a micromachined tip array to allow for probe replacement. It is part of a microscopy station originally intended for NASA's 2001 Mars lander to identify the size, distribution, and shape of Martian dust and soil particles. As well as imaging topographically down to nanometer resolution, this instrument can be used to reveal chemical information and perform infrared and Raman spectroscopy at unprecedented resolution.