학술논문
NASA Goddard Space Flight Center's Compendium of Total Ionizing Dose, Displacement Damage Dose, and Single-Event Effects Test Results
Document Type
Report
Author
Source
Subject
Language
English
Abstract
Total ionizing dose, displacement damage dose, and single-event effect testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include optoelectronics, digital, analog, bipolar devices, and FPGAs.