학술논문

MBE법으로 성장한 InAs 양자점의 photoreflectance 특성
Photoreflectance characteristics of InAs Quantum Dots Grown by MBE
Document Type
Article
Source
자연과학연구논문집. Dec 31, 2014 12(1):25
Subject
InAs/GaAs
Quantum dot
QD
photoreflectance
PR
Language
Korean
ISSN
2093-8624
Abstract
The photoreflectance of self-assembled InAs/GaAs quantum dots(QD) grown by MBE were investigated. The results of the InAs/GaAs single layer quantum dots without buffer layer (S1) and with 500 nm buffer layer (S2) are as follows. From the PR measurement as a function of temperature, the PR signal associated with QDs has been observed at low temperature, but it was not observed at high temperature. This was explained by thermal escaping of confined carriers in QDs at high temperature, thus generated electron-hole pair by pump beam cannot modulate the states of QDs. In the case of the QD with buffer layer, PR peaks related with QD and WL are observed at relatively high temperature. This result show that the QD samples with buffer layer has uniform electric field at the surface. Because, the modulation efficiency of PR peaks related QD and WL is increased.

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