학술논문
Degradation behavior of deep UV-LEDs studied by electro-optical methods and transmission electron microscopy
Document Type
Article
Author
Source
Current Applied Physics, 19(1), pp.20-24 Jan, 2019
Subject
Language
English
ISSN
1567-1739
Abstract
Degradation mechanism of 265-nm deep ultraviolet light emitting diodes (UV-LEDs) has been investigated by means of electroluminescence, current-voltage measurement, capacitance-voltage measurement, and transmission electron microscopy (TEM) equipped with energy dispersive X-ray spectrometer (EDAX). It is revealed that a major degradation mode of UV-LEDs may be the leakage current induced optical degradation. The current pathway is demonstrated by TEM with EDAX, indicating that the contact metals can partially interact with ptype materials, which accelerate the degradation of LEDs. The presented results can help to understand the degradation mechanisms and improve the reliability of deep UV-LEDs.